Unit pixels configured to output different pixel signals through different lines and image sensors including the same
Granted 5 Jan 2016 · 1 office action
Assignee: Samsung Electronics
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Attorney: Attorney · Log in to unlock
Inventors: Seog-Heon Ham, Kang-Sun Lee, Seung-Hyun Lim, Kwi-Sung Yoo +1 · Examiner: Gevell Selby · AU 2664 · TC 2600
Life of the application
8 dated eventsAbstract
An image sensor includes a pixel array and a plurality of pairs of column lines. The pixel array includes a plurality of unit pixel areas arranged in a plurality of rows and columns. Each of the unit pixel areas includes a readout circuit connected to a corresponding pair of column lines, and first and second photo-electric conversion devices sharing the readout circuit. Each of the unit pixel areas is configured to output a first pixel signal corresponding to a photoelectron generated by the first photo-electric conversion device through the first column line, and to output a second pixel signal corresponding to a photoelectron generated by the second photo-electric conversion device through the second column line.
Description
11 parts›CROSS-REFERENCE TO RELATED APPLICATION
This application claims priority under 35 U.S.C. §119 to Korean Patent Application No. 10-2013-0026291, filed on Mar. 12, 2013, in the Korean Intellectual Property Office (KIPO), the contents of which are herein incorporated by reference in their entirety.
›BACKGROUND
1. Technical Field
Example embodiments relate generally to image sensors, and more particularly image sensors including a plurality of unit pixel arrays where two pixels share one readout circuit.
2. Description of the Related Art
In general, a complementary-metal-oxide-semiconductor (CMOS) image sensor is a device used in a smart phone or a digital still camera to capture an image and the CMOS image sensor is required to be manufactured in a small size according to the tendency of portable devices manufactured in a small size with a slim structure.
As image sensors have tended toward the miniaturization, a size of a unit pixel area is reduced so that the fill-factor (a ratio of a photodiode area to a unit pixel area) is also reduced.
For this reason, recently, a shared pixel structure allowing two photodiodes to share one readout circuit has been adopted to reduce an area of switch transistors per a unit pixel.
In the shared pixel structure, the minimization for a 1H period is necessary for a high frame rate, but there is limitation in the minimization due to the restriction of pixel charge transmission and A/D conversion time. In order to overcome the above limitation, a 2RSR (2 Row Simultaneously Read) scheme is employed to simultaneously read 2 rows for the 1H period.
However, when the 2RSR scheme is used, if photodiodes having mutually different colors share one column line through one readout circuit, mismatch may occur between colors.
›SUMMARY · 1 of 2
Some example embodiments provide an image sensor capable of suppressing and/or preventing mismatch between colors by allowing mutually different colors to be output through mutually different column lines when two rows are read simultaneously and/or concurrently.
According to example embodiments, an image sensor includes: a pixel array, and a plurality of pairs of column lines. The pixel array includes a plurality of unit pixel areas aligned as a plurality of rows and columns. Each of the unit pixel areas includes: a (e.g., a single) readout circuit connected to a corresponding pair of column lines, and first and second photo-electric conversion devices sharing the readout circuit. Each of the unit pixel areas is configured to output a first pixel signal corresponding to a first photoelectron generated by the first photo-electric conversion device through the first column line, and to output a second pixel signal corresponding to a second photoelectron generated by the second photo-electric conversion device through the second column line.
In example embodiments, the first photoelectron may correspond to a first color and the second photoelectron may correspond to a second color, which is different from the first color.
Each readout circuit aligned in an odd row of the plurality of rows may output the first pixel signal through the first column line in response to an odd readout signal, and each readout circuit aligned in an even row of the plurality of rows may output the second pixel signal through the second column line in response to the odd readout signal.
Each readout circuit aligned in an even row of the plurality of rows may output the first pixel signal through the first column line in response to an even readout signal, and each readout circuit aligned in an odd row of the plurality of rows may output the second pixel signal through the second column line in response to the even readout signal.
Each unit pixel area aligned in an odd row of the plurality of rows may include a first charge transmit transistor is configured to transmit a photo charge generated by the first photo-electric conversion device to a shared node when an odd readout operation is performed, and a second charge transmit transistor configured to transmit a photo charge generated from the second photo-electric conversion device to the shared node when an even readout operation is performed. The readout circuit included in each unit pixel area aligned in the odd row of the plurality of rows may include: a reset transistor configured to reset the shared node with a supply voltage in response to a reset signal; a drive transistor configured to drive an output node based on quantity of charges at the shared node; a first select transistor configured to connect the output node to the first column line in response to an odd readout signal, and a second select transistor configured to connect the output node to the second column line in response to an even readout signal.
Each unit pixel area aligned in an even row of the plurality of rows may include a first charge transmit transistor configured to transmit a photo charge generated by the first photo-electric conversion device to a shared node when an even readout operation is performed, and a second charge transmit transistor configured to transmit a photo charge generated from the second photo-electric conversion device to the shared node when an odd readout operation is performed. The readout circuit included in each unit pixel area aligned in the even row of the plurality of rows may include: a reset transistor configured to reset the shared node with a supply voltage in response to a reset signal; a drive transistor configured to drive an output node based on quantity of charges at the shared node; a third select transistor configured to connect the output node to the first column line in response to an even readout signal, and a fourth select transistor configured to connect the output node to the second column line in response to an odd readout signal.
According to example embodiments, an image sensor includes: a pixel array including a plurality of unit pixel areas arranged in a plurality of rows and columns; and a plurality of pairs of column lines, each pair of column lines being aligned in a column among the plurality of columns. Each of the plurality of unit pixel areas includes: a readout circuit connected to a corresponding pair of column lines; and first and second photo-electric conversion devices sharing the readout circuit. Each of the plurality of unit pixel areas arranged in an odd row among the plurality of rows is configured to output first and second pixel signals corresponding to photoelectrons generated by the first and second photo-electric conversion devices through a first column line among the corresponding pair of column lines; and each of the plurality of unit pixel areas arranged in an even row among the plurality of rows is configured to output the first and second pixel signals corresponding to the photoelectrons generated by the first and second photo-electric conversion devices through a second column line among the corresponding pair of column lines.
According to some example embodiments, the first photo-electric conversion devices of unit pixel areas in the even row may be between the first and second photo-electric conversion devices of corresponding unit pixel areas in the odd row, and the second photo-electric conversion devices of the corresponding unit pixel areas in the odd row may be between the first and second photo-electric conversion devices of the unit pixel areas in the even row.
The first and second photo-electric conversion devices of the corresponding unit pixel areas in the odd row may be configured to generate photoelectrons corresponding to a first color, and the first and second photo-electric conversion devices of the corresponding unit pixel areas in the even row may be configured to generate photoelectrons corresponding to a second color, which is different from the first color.
›SUMMARY · 2 of 2
Each readout circuit in the odd row may be configured to output the first pixel signal through the first column line in response to an odd readout signal, and each readout circuit in the even row may be configured to output the first pixel signal through the second column line in response to the odd readout signal.
Each readout circuit in the odd row may be configured to output the second pixel signal through the first column line in response to an even readout signal, and each readout circuit in the even row may be configured to output the second pixel signal through the second column line in response to the even readout signal.
Each unit pixel area may include: a first charge transmit transistor configured to transmit a photo charge generated by the first photo-electric conversion device to a shared node when an odd readout operation is performed; and a second charge transmit transistor configured to transmit a photo charge generated by the second photo-electric conversion device to the shared node when an even readout operation is performed.
The readout circuit included in each unit pixel area may include: a reset transistor configured to reset the shared node with a supply voltage in response to a reset signal; a drive transistor configured to drive an output node based on quantity of charges at the shared node; and a select transistor configured to connect the output node to one of the first and second column lines in response to a select signal. The select transistor in the readout circuit included in each unit pixel area in the odd row may be configured to connect the output node to the first column line in response to the select signal, and the select transistor in the readout circuit included in each unit pixel area in the even row may be configured to connect the output node to the second column line in response to the select signal.
According to example embodiments, a unit pixel having a shared pixel structure includes: a first photo-electric conversion device configured to generate a first pixel signal corresponding to a first color; a second photo-electric conversion device configured to generate a second pixel signal corresponding to a second color, which is different from the first color; and a readout circuit connected to the first and second photo-electric devices, the readout circuit being configured to output the first pixel signal and the second pixel signal via different column lines.
The first and second photo-electric conversion devices may share the readout circuit. The unit pixel may include only a single readout circuit.
According to example embodiments an image sensor includes: a pixel array including a plurality of the unit pixels arranged in a plurality of rows and columns; and a plurality of pairs of column lines, each pair of column lines being aligned with a column among the plurality of columns. Each unit pixel has a shared pixel structure and includes: a first photo-electric conversion device configured to generate a first pixel signal corresponding to a first color; a second photo-electric conversion device configured to generate a second pixel signal corresponding to a second color, which is different from the first color; and a readout circuit connected to the first and second photo-electric devices, the readout circuit being configured to output the first pixel signal and the second pixel signal via different column lines. The readout circuit is configured to output the first pixel signal to the first column line among a corresponding pair of column lines, and to output the second pixel signal via the second column line among the corresponding pair of column lines.
The readout circuit may be configured to output the first pixel signal only via the first column line, and to output the second pixel signal only via the second column line.
›BRIEF DESCRIPTION OF THE DRAWINGS
Illustrative, non-limiting example embodiments will be more clearly understood from the following detailed description taken in conjunction with the accompanying drawings.
FIG. 1 a is a schematic block diagram illustrating an image sensor according to an example embodiment.
FIG. 1 b is a detailed block diagram illustrating the image sensor according to an example embodiment.
FIG. 2 is a view illustrating a portion of a pixel array unit according to an example embodiment.
FIG. 3 is a circuit diagram illustrating an equivalent circuit corresponding to a first row and a second row of the pixel array unit of FIG. 2 .
FIG. 4 is an example timing chart to explain example operation of the equivalent circuit of FIG. 3 .
FIG. 5 is a view illustrating a portion of the pixel array unit according to another example embodiment.
FIG. 6 is a layout view illustrating unit pixel areas of a first row and a second row of FIG. 5 .
FIG. 7 is a circuit diagram illustrating an equivalent circuit of FIG. 6 .
FIG. 8 is an example timing chart to explain example operation of the equivalent circuit of FIG. 7 .
FIG. 9 is a block diagram illustrating a computing system and an interface used in the computing system according to an example embodiment.
›DETAILED DESCRIPTION · 1 of 6
Various example embodiments will be described more fully with reference to the accompanying drawings, in which some example embodiments are shown. The present inventive concepts may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the present inventive concepts to those skilled in the art. Like reference numerals refer to like elements throughout this application.
It will be understood that, although the terms first, second, etc. may be used herein to describe various elements, these elements should not be limited by these terms. These terms are used to distinguish one element from another. For example, a first element could be termed a second element, and, similarly, a second element could be termed a first element, without departing from the scope of the present inventive concepts. As used herein, the term “and/or” includes any and all combinations of one or more of the associated listed items.
It will be understood that when an element is referred to as being “connected” or “coupled” to another element, it can be directly connected or coupled to the other element or intervening elements may be present. In contrast, when an element is referred to as being “directly connected” or “directly coupled” to another element, there are no intervening elements present. Other words used to describe the relationship between elements should be interpreted in a like fashion (e.g., “between” versus “directly between,” “adjacent” versus “directly adjacent,” etc.).
The terminology used herein is for the purpose of describing particular embodiments and is not intended to be limiting of the inventive concepts. As used herein, the singular forms “a,” “an” and “the” are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms “comprises,” “comprising,” “includes” and/or “including,” when used herein, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this inventive concepts belong. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.
FIG. 1 a is a schematic block diagram illustrating an image sensor according to an example embodiment.
Referring to FIG. 1 a , the image sensor 100 according to the example embodiment includes an active pixel array (APS array) 110 , a row driver 120 , a correlated double sample (CDS) block 130 , an analog digital converter (ADC) 140 , a ramp generator 160 , a timing generator 170 , a control register block 108 and a buffer 190 .
The image sensor 100 may sense an object 400 photographed through a lens 500 under the control of a digital signal processor (DSP) 200 and the DSP 200 may output an image sensed by the image sensor 100 to a display unit 300 . The display unit 300 may include various types of devices capable of outputting the image. For instance, the display unit 300 may include a computer, a portable phone and other image output terminals.
The DSP 200 includes a camera control 210 , an image signal processor 220 and a PC I/F 230 . The camera control 210 controls the control register block 180 . The camera control 210 may control the image sensor 100 , that is, the control register block 180 by using an I 2 C (Inter-integrated circuit), but the example embodiments are not limited thereto.
The image signal processor 220 receives image data, which are output signals of the buffer 190 , to process/treat the image suitably for eyes of persons and outputs the processed/treated image to the display unit 300 through the PC I/F 230 .
Although the image signal processor 220 is illustrated as it is positioned in the DSP 200 in FIG. 1 a , the position of the image signal processor 220 may be changed by those skilled in the art. For instance, the image signal processor 220 may be positioned in the image sensor 100 .
The active pixel array 110 includes a plurality of photo sensing devices, such as photodiodes or pinned photodiodes. The active pixel array 110 detects light by using the photo sensing devices and generates an image signal by converting the light into an electric signal. The active pixel array 110 includes a plurality of rows and columns and unit pixel areas are aligned in the form of a matrix. In the unit pixel area, two color pixels share one readout circuit.
The timing generator 170 may output control signals to the row driver 120 , the ADC 140 and the ramp generator 160 , respectively, to control the operations of the row driver 120 , the ADC 140 and the ramp generator 160 . The control register block 180 may generate control signals to the ramp generator 160 , the timing generator 170 and the buffer 190 to control the operations of the ramp generator 160 , the timing generator 170 and the buffer 190 . The control register block 180 may be operated under the control of the camera control 210 .
The row driver 120 drives the active pixel array 110 in a unit of row. For instance, the row driver 120 may generate a row select signal. The row driver 120 may include a shift register or an address decoder and selectively scans in a unit of horizontal line in response to vertical and horizontal synchronous signals. A reset signal, a transfer signal and a select signal may be output to a reset line, a transfer line and a select line, respectively, in every horizontal line.
›DETAILED DESCRIPTION · 2 of 6
In addition, the active pixel array 110 outputs the reset signal and an image signal to the CDS block 130 from a row selected by the row select signal supplied from the row driver 120 .
Upon receiving the reset signal and the image signal, the CDS block 130 may perform the correlated double sampling with respect to the reset signal and the image signal.
The ADC 140 compares a ramp signal Vramp supplied from the ramp generator 160 with a correlated double sampling signal output from the CDS block 130 , generates a result signal and counts the result signal to output the count value to the buffer 190 .
The buffer 190 temporarily stores a digital signal output from the ADC 130 and outputs the digital signal by sensing and amplifying the digital signal. In order to temporarily store the digital signal, the buffer 190 may include a plurality of column memory blocks (for instance, SRAM) each of which is included in each row and a sense amplifier SA to sense and amplify the digital signal output from and the ADC 130 .
Pixel signals, which are processed in each pixel row, may be sequentially output from the CDS block 130 , the ADC 140 and the buffer 190 . In addition, a give, desired or predetermined signal processing may be performed with respect to analog pixel signals output from each pixel of two rows which are simultaneously selected.
FIG. 1 b is a detailed block diagram illustrating the image sensor according to an example embodiment.
Referring to FIG. 1 b , the image sensor 100 according to the example embodiment includes the active pixel array 110 , the row driver 120 , the analog digital converter 140 , the ramp generator 160 , the timing generator 170 , and the buffer 190 . The analog digital converter 140 includes a comparator block 141 and a counter block 143 .
The active pixel array 110 may include a plurality of pixels 111 connected to a plurality of row lines and column lines and aligned in the form of a matrix.
Each of the pixels 111 may include a red pixel to convert light having a red spectrum band into an electric signal, a green pixel to convert light having a green spectrum band into the electric signal, and a blue pixel to convert light having a blue spectrum band into the electric signal.
In addition, color filter arrays may be aligned on the pixels 111 constituting the active pixel array 110 , respectively, to allow light having a specific spectrum band to pass there through.
The row driver 120 may decode the row control signal (e.g., address signal) generated from the timing generator 170 to select one of row lines constituting the active pixel array 110 in response to the decoded row control signal.
The CDS block 130 may perform the correlated double sampling with respect to the pixel signal output from a unit pixel connected to one of column lines constituting the active pixel array 110 .
The comparator block 141 includes a plurality of comparators 141 a connected to the CDS block 130 and the ramp generator 160 . In this case, the CDS block 130 may be connected to a first input terminal of the comparator 141 a and the ramp generator 160 may be connected to a second input terminal of the comparator 141 a.
The comparator 141 a receives a value of an output signal of the CDS block 140 and a value of the ramp signal of the ramp generator 160 , compares the values with each other and outputs a comparison result signal through an output terminal. At this time the comparison result signal output from the comparator 141 a may correspond to the differential value between the image signal and the reset signal, which may vary depending on the intensity of illumination of external light, and the ramp signal is used to output the difference between the image signal and the reset signal so that the difference between the image signal and the reset signal may be detected and output according to the slope of the ramp signal. The ramp generator 160 may operate based on the control signal generated from the timing generator 170 .
The counter block 143 includes a plurality of counters 143 a connected to the output terminals of the comparators 141 a , respectively, to output the digital signal by counting the comparison result signal according to the clock CNT_CLK input from the timing generator 170 . The clock CNT_CLK may be generated by a counter controller (not shown) provided in the counter block 143 or the timing generator 170 based on a counter control signal generated from the timing generator 170 .
The counter 143 a may include an up/down counter and a bit-wise inversion counter. The bit-wise inversion counter may operate similarly to the up/down counter. For instance, the bit-wise inversion counter may have a function of up-counting as well as a function of making 1's complement by inversing all bits in the counter when a specific signal is input. Thus, the bit-wise inversion counter can perform the reset count and can convert the reset count into 1's complement, that is, a minus value, by inversing the reset count.
The buffer 190 includes a column memory block 191 and a sense amplifier 192 , and the column memory block 191 includes a plurality of memories 193 .
The memories 193 may operate according to a memory control signal generated from a memory controller (not shown) installed in the column memory block 191 or the timing generator 170 based on the control signal generated from the timing generator 170 . The memory 193 may include an SRAM.
The column memory block 191 temporarily stores the digital signal output from the counters 143 a and outputs the digital signal to the sense amplifier 192 according to the memory control signal and the sense amplifier 192 outputs the digital signal by sensing and amplifying the digital signal.
FIG. 2 is a view illustrating a portion of the active pixel array unit 110 according to an example embodiment. FIG. 3 is a circuit diagram illustrating an equivalent circuit corresponding to a first row and a second row of the pixel array unit of FIG. 2 .
Referring to FIG. 2 , a first row ROW 0 includes a reset line RST 0 , a first charge transmit line TXL 00 , a second charge transmit line TXL 01 , a first select line SEL 00 and a second select line SEL 01 . In the same way, a second row ROW 1 includes a reset line RST 1 , a first charge transmit line TXL 10 , a second charge transmit line TXL 11 , a first select line SEL 10 and a second select line SEL 11 , a third row ROW 2 includes a reset line RST 2 , a first charge transmit line TXL 20 , a second charge transmit line TXL 21 , a first select line SEL 20 and a second select line SEL 21 , and a fourth row ROW 3 includes a reset line RST 3 , a first charge transmit line TXL 30 , a second charge transmit line TXL 31 , a first select line SEL 30 and a second select line SEL 31 .
›DETAILED DESCRIPTION · 3 of 6
A first column CoL 0 includes a first column line CL 00 and a second column line CL 01 and a second column CoL 1 includes a first column line CL 10 and a second column line CL 11 .
Unit pixel areas UPX 00 to UPX 03 are disposed at intersections between the first column CoL 0 and the first to fourth rows ROW 0 to ROW 3 .
The unit pixel area UPX 00 includes a green pixel G 00 , a blue pixel B 01 and a readout circuit RO 00 , the unit pixel area UPX 01 includes a green pixel G 02 , a blue pixel B 03 and a readout circuit RO 01 , the unit pixel area UPX 02 includes a green pixel G 04 , a blue pixel B 05 and a readout circuit RO 02 , and the unit pixel area UPX 03 includes a green pixel G 06 , a blue pixel B 07 and a readout circuit RO 03 .
Referring to FIG. 3 , the odd unit pixel area UPX 00 includes two photo-electric conversion devices, that is, photodiodes PD 0 and PD 1 . The photodiode PD 0 converts light received from the green pixel G 00 into a photo charge and the photodiode PD 1 converts light received from the blue pixel B 01 into the photo charge. The photo charge having the green color generated from the photodiode PD 0 is transmitted to the readout circuit RO 00 through a charge transmit transistor TM 00 and the photo charge having the blue color generated from the photodiode PD 1 is transmitted to the readout circuit RO 00 through a charge transmit transistor TM 01 . The charge transmit transistor TM 00 has a gate connected to the first charge transmit line TXL 00 and the charge transmit transistor TM 01 has a gate connected to the second charge transmit line TXL 01 , so the charge transmit transistors TM 00 and TM 01 are selectively switched.
The readout circuit RO 00 includes a shared node FN 0 , a reset transistor RM 0 , a drive transistor DM 0 , a first select transistor SM 00 and a second select transistor SM 01 . The reset transistor RM 0 has a source connected to a power supply terminal, a drain connected to the shared node FN 0 and a gate connected to the reset line RST 0 . The drive transistor DM 0 has a source connected to the power supply terminal, a drain connected to an output node NO 0 and a gate connected to the shared node FN 0 . The first select transistor SM 00 has a source connected to the output node NO 0 , a drain connected to the first column line CL 00 and a gate connected to the first select line SEL 00 . The second select transistor SM 01 has a source connected to the output node NO 0 , a drain connected to the second column line CL 01 and a gate connected to the second select line SEL 01 . The first and second select transistors SM 00 and SM 01 are selectively switched with each other.
An even unit pixel area UPX 01 includes two photo-electric conversion devices, that is, photodiodes PD 2 and PD 3 . The photodiode PD 2 converts light received from the green pixel G 02 into a photo charge having a green color and the photodiode PD 3 converts light received from the blue pixel B 03 into the photo charge having a blue color. The photo charge having the green color generated from the photodiode PD 2 is transmitted to the readout circuit RO 01 through a charge transmit transistor TM 10 and the photo charge having the blue color generated from the photodiode PD 3 is transmitted to the readout circuit RO 01 through a charge transmit transistor TM 11 . The charge transmit transistor TM 10 has a gate connected to the first charge transmit line TXL 10 and the charge transmit transistor TM 11 has a gate connected to the second charge transmit line TXL 11 , so the charge transmit transistors TM 10 and TM 11 are selectively switched.
The readout circuit RO 01 includes a shared node FN 1 , a reset transistor RM 1 , a drive transistor DM 1 , a first select transistor SM 10 and a second select transistor SM 11 . The reset transistor RM 1 has a source connected to a power supply terminal, a drain connected to the shared node FN 1 and a gate connected to the reset line RST 1 . The drive transistor DM 1 has a source connected to the power supply terminal, a drain connected to an output node NO 1 and a gate connected to the shared node FN 1 . The first select transistor SM 10 has a source connected to the output node NO 1 , a drain connected to the first column line CL 00 and a gate connected to the first select line SEL 10 . The second select transistor SM 11 has a source connected to the output node NO 1 , a drain connected to the second column line CL 01 and a gate connected to the second select line SEL 11 . The first and second select transistors SM 10 and SM 11 are selectively switched with each other.
FIG. 4 is an example timing chart to explain example operation of the equivalent circuit of FIG. 3 .
Referring to FIG. 4 , if a reset pulse signal 202 is applied to the gates of the reset transistors RM 0 and RM 1 through the reset lines RST 0 and RST 1 during a first horizontal period, the shared nodes FN 0 and FN 1 are concurrently charged with a supply voltage. Thus, the drive transistors DM 0 and DM 1 are turned on so that a reset voltage signal is output to the output nodes NO 0 and NO 1 . Then, if a select signal 204 is applied to the gates of the select transistors SM 00 and SM 11 through the first select line SEL 00 of the readout circuit RO 00 of the odd row ROW 0 and the second select line SEL 11 of the readout circuit RO 01 of the even row ROW 1 , the select transistors SM 00 and SM 11 are concurrently turned on. Thus, a reset voltage signal 208 a of the output node NO 0 is output to the column line CL 00 and a reset voltage signal 210 a of the output node NO 1 is output to the column line CL 01 . The reset voltage signals output to the column lines CL 00 and CL 01 are concurrently sampled in the CDS block 130 .
Then, if a charge transmit signal 206 is applied to the gates of the charge transmit transistors TM 00 and TM 11 through the first charge transmit line TXL 00 of the readout circuit RO 00 of the odd row ROW 0 and the second charge transmit line TXL 11 of the readout circuit RO 01 of the even row ROW 1 , a discharge path to the ground is formed through the charge transmit transistor TM 00 and the photodiode PD 0 so that the level of the shared node FN 0 is reduced to the voltage level corresponding to the photo charge having the green color generated in the power supply voltage level. In the same way, a discharge path to the ground is formed through the charge transmit transistor TM 11 and the photodiode PD 3 so that the level of the shared node FN 1 is reduced to the voltage level corresponding to the photo charge having the blue color generated in the power supply voltage level.
›DETAILED DESCRIPTION · 4 of 6
A green color sensing signal and a blue color sensing signal, which are sensed by the shared nodes FN 0 and FN 1 , are amplified through the drive transistors DM 0 and DM 1 , and the amplified signals are output to the column lines CL 00 and CL 01 through the select transistors SM 00 and SM 11 as output signals 208 b and 210 b , respectively. The output signals 208 b and 210 b output to the column lines CL 00 and CL 01 are concurrently sampled in the CDS block 130 .
If a reset pulse signal 212 is applied to the gates of the reset transistors RM 0 and RM 1 through the reset lines RST 0 and RST 1 during a second horizontal period, the shared nodes FN 0 and FN 1 are concurrently charged with a supply voltage. Thus, the drive transistors DM 0 and DM 1 are turned on so that a reset voltage signal is output to the output nodes NO 0 and NO 1 . Then, if a select signal 214 is applied to the gates of the select transistors SM 10 and SM 01 through the second select line SEL 01 of the readout circuit RO 00 of the odd row ROW 0 and the first select line SEL 10 of the readout circuit RO 01 of the even row ROW 1 , the select transistors SM 10 and SM 01 are concurrently turned on. Thus, a reset voltage signal 218 a of the output node NO 1 is output to the column line CL 00 and a reset voltage signal 220 a of the output node NO 0 is output to the column line CL 01 . The reset voltage signals output to the column lines CL 00 and CL 01 are concurrently sampled in the CDS block 130 .
Then, if a charge transmit signal 216 is applied to the gates of the charge transmit transistors TM 10 and TM 01 through the second charge transmit line TXL 01 of the readout circuit RO 00 of the odd row ROW 0 and the first charge transmit line TXL 10 of the readout circuit RO 01 of the even row ROW 1 , a discharge path to the ground is formed through the charge transmit transistor TM 01 and the photodiode PD 1 so that the level of the shared node FN 0 is reduced to the voltage level corresponding to the photo charge having the blue color generated in the power supply voltage level. In the same way, a discharge path to the ground is formed through the charge transmit transistor TM 10 and the photodiode PD 2 so that the level of the shared node FN 1 is reduced to the voltage level corresponding to the photo charge having the green color generated in the power supply voltage level.
A green color sensing signal and a blue color sensing signal, which are sensed by the shared nodes FN 0 and FN 1 , are amplified through the drive transistors DM 0 and DM 1 , and the amplified signals are output to the column lines CL 01 and CL 00 through the select transistors SM 01 and SM 10 as output signals 220 b and 218 b , respectively. The output signals 220 b and 218 b output to the column lines CL 01 and CL 00 are concurrently sampled in the CDS block 130 .
The above procedure may be applied to the third row and the fourth row, so that only signals generated from green pixels G 00 , G 02 , G 04 , G 06 . . . and Gn are sequentially output to the first column line CL 00 and only signals generated from blue pixels B 03 , B 01 , B 07 , B 05 . . . and Bn are sequentially output to the second column line CL 01 .
Therefore, the green colors are exclusively output to the odd column line CL 00 and the blue colors are exclusively output to the even colon line CL 01 while concurrently reading out the green color pixel row and the blue color pixel row.
Thus, the same color may be output through the same path, so that the color mismatch between rows of the same color may not occur.
In one example embodiment, the blue color may be primarily output from the fourth row and then output from the second row. However, this output sequence may be rearranged in the image sensor 100 or may be rearranged in the DSP 200 after the blue colors have been output.
FIG. 5 is a view illustrating a portion of the pixel array unit according to another example embodiment, FIG. 6 is a layout view illustrating unit pixel areas of a first row and a second row of FIG. 5 and FIG. 7 is a circuit diagram illustrating an equivalent circuit of FIG. 6 .
Referring to FIG. 5 , a first row ROW 0 includes a reset line RST 0 , a first charge transmit line TXL 00 , a second charge transmit line TXL 01 , and a select line SEL 0 . In the same way, a second row ROW 1 includes a reset line RST 1 , a first charge transmit line TXL 10 , a second charge transmit line TXL 11 , and a select line SEL 1 , a third row ROW 2 includes a reset line RST 2 , a first charge transmit line TXL 20 , a second charge transmit line TXL 21 , and a select line SEL 2 , and a fourth row ROW 3 includes a reset line RST 3 , a first charge transmit line TXL 30 , a second charge transmit line TXL 31 and a select line SEL 3 .
A first column CoL 0 includes a first column line CL 00 and a second column line CL 01 and a second column CoL 1 includes a first column line CL 10 and a second column line CL 11 .
Unit pixel areas UPX 00 to UPX 03 are disposed at intersections between the first column CoL 0 and the first to fourth rows ROW 0 to ROW 3 .
The unit pixel area UPX 00 includes a green pixel G 00 , a green pixel G 02 and a readout circuit RO 00 , the unit pixel area UPX 01 includes a blue pixel B 01 , a blue pixel B 03 and a readout circuit RO 01 , the unit pixel area UPX 02 includes a green pixel G 04 , a green pixel G 06 and a readout circuit RO 02 , and the unit pixel area UPX 03 includes a blue pixel B 05 , a blue pixel B 07 and a readout circuit RO 03 .
Referring to FIG. 6 , a photodiode PD 1 of the unit pixel area UPX 01 , which is adjacent to the unit pixel area UPX 00 , is disposed between photodiodes PD 0 and PD 2 of the unit pixel area UPX 00 , and a photodiode PD 2 of the unit pixel area UPX 00 is disposed between photodiodes PD 1 and PD 3 of the unit pixel area UPX 01 , which is adjacent to the unit pixel area UPX 00 .
Referring to FIG. 7 , the odd unit pixel area UPX 00 includes two photo-electric conversion devices, that is, photodiodes PD 0 and PD 2 . The photodiode PD 0 converts light received from the green pixel G 00 into a photo charge and the photodiode PD 2 converts light received from the green pixel G 02 into the photo charge. The photo charge having the green color generated from the photodiode PD 0 is transmitted to the readout circuit RO 00 through a charge transmit transistor TM 00 and the photo charge having the green color generated from the photodiode PD 2 is transmitted to the readout circuit RO 00 through a charge transmit transistor TM 01 . The charge transmit transistor TM 00 has a gate connected to the first charge transmit line TXL 00 and the charge transmit transistor TM 01 has a gate connected to the second charge transmit line TXL 01 , so the charge transmit transistors TM 00 and TM 01 are selectively switched.
›DETAILED DESCRIPTION · 5 of 6
The readout circuit RO 00 includes a shared node FN 0 , a reset transistor RM 0 , a drive transistor DM 0 , and a select transistor SM 0 . The reset transistor RM 0 has a source connected to a power supply terminal, a drain connected to the shared node FN 0 and a gate connected to the reset line RST 0 . The drive transistor DM 0 has a source connected to the power supply terminal, a drain connected to an output node NO 0 and a gate connected to the shared node FN 0 . The select transistor SM 0 has a source connected to the output node NO 0 , a drain connected to the first column line CL 00 and a gate connected to the select line SEL 0 .
An even unit pixel area UPX 01 includes two photo-electric conversion devices, that is, photodiodes PD 1 and PD 3 . The photodiode PD 1 converts light received from the blue pixel B 01 into a photo charge having a blue color and the photodiode PD 3 converts light received from the blue pixel B 03 into the photo charge having a blue color. The photo charge having the blue color generated from the photodiode PD 1 is transmitted to the readout circuit RO 01 through a charge transmit transistor TM 10 and the photo charge having the blue color generated from the photodiode PD 3 is transmitted to the readout circuit RO 01 through a charge transmit transistor TM 11 . The charge transmit transistor TM 10 has a gate connected to the first charge transmit line TXL 10 and the charge transmit transistor TM 11 has a gate connected to the second charge transmit line TXL 11 , so the charge transmit transistors TM 10 and TM 11 are selectively switched.
The readout circuit RO 01 includes a shared node FN 1 , a reset transistor RM 1 , a drive transistor DM 1 , and a select transistor SM 1 . The reset transistor RM 1 has a source connected to a power supply terminal, a drain connected to the shared node FN 1 and a gate connected to the reset line RST 1 . The drive transistor DM 1 has a source connected to the power supply terminal, a drain connected to an output node NO 1 and a gate connected to the shared node FN 1 . The select transistor SM 1 has a source connected to the output node NO 1 , a drain connected to the second column line CL 01 and a gate connected to the select line SEL 1 .
FIG. 8 is an example timing chart to explain example operation of the equivalent circuit of FIG. 7 .
Referring to FIG. 8 , if a reset pulse signal 302 is applied to the gates of the reset transistors RM 0 and RM 1 through the reset lines RST 0 and RST 1 during a first horizontal period, the shared nodes FN 0 and FN 1 are concurrently charged with a supply voltage. Thus, the drive transistors DM 0 and DM 1 are turned on so that a reset voltage signal is output to the output nodes NO 0 and NO 1 . Then, if a select signal 304 is applied to the gates of the select transistors SM 0 and SM 1 through the select line SEL 0 of the readout circuit RO 00 of the odd row ROW 0 and the select line SEL 1 of the readout circuit RO 01 of the even row ROW 1 , the select transistors SM 0 and SM 1 are concurrently turned on. Thus, a reset voltage signal 308 a of the output node NO 0 is output to the column line CL 00 and a reset voltage signal 310 a of the output node NO 1 is output to the column line CL 01 . The reset voltage signals output to the column lines CL 00 and CL 01 are concurrently sampled in the CDS block 130 .
Then, if a charge transmit signal 306 is applied to the gates of the charge transmit transistors TM 00 and TM 10 through the first charge transmit line TXL 00 of the readout circuit RO 00 of the odd row ROW 0 and the first charge transmit line TXL 10 of the readout circuit RO 01 of the even row ROW 1 , a discharge path to the ground is formed through the charge transmit transistor TM 00 and the photodiode PD 0 so that the level of the shared node FN 0 is reduced to the voltage level corresponding to the photo charge having the green color generated in the power supply voltage level. In the same way, a discharge path to the ground is formed through the charge transmit transistor TM 10 and the photodiode PD 1 so that the level of the shared node FN 1 is reduced to the voltage level corresponding to the photo charge having the blue color generated in the power supply voltage level.
A green color sensing signal and a blue color sensing signal, which are sensed by the shared nodes FN 0 and FN 1 , are amplified through the drive transistors DM 0 and DM 1 , and the amplified signals are output to the column lines CL 00 and CL 01 through the select transistors SM 0 and SM 1 as output signals 308 b and 310 b , respectively. The output signals 308 b and 310 b output to the column lines CL 00 and CL 01 are concurrently sampled in the CDS block 130 .
If a reset pulse signal 312 is applied to the gates of the reset transistors RM 0 and RM 1 through the reset lines RST 0 and RST 1 during a second horizontal period, the shared nodes FN 0 and FN 1 are concurrently charged with a supply voltage. Thus, the drive transistors DM 0 and DM 1 are turned on so that a reset voltage signal is output to the output nodes NO 0 and NO 1 . Then, if a select signal 314 is applied to the gates of the select transistors SM 0 and SM 1 through the select line SEL 0 of the readout circuit RO 00 of the odd row ROW 0 and the select line SEL 1 of the readout circuit RO 01 of the even row ROW 1 , the select transistors SM 0 and SM 1 are concurrently turned on. Thus, a reset voltage signal 318 a of the output node NO 1 is output to the column line CL 00 and a reset voltage signal 320 a of the output node NO 0 is output to the column line CL 01 . The reset voltage signals output to the column lines CL 00 and CL 01 are concurrently sampled in the CDS block 130 .
Then, if a charge transmit signal 316 is applied to the gates of the charge transmit transistors TM 01 and TM 11 through the second charge transmit line TXL 01 of the readout circuit RO 00 of the odd row ROW 0 and the second charge transmit line TXL 11 of the readout circuit RO 01 of the even row ROW 1 , a discharge path to the ground is formed through the charge transmit transistor TM 01 and the photodiode PD 2 so that the level of the shared node FN 0 is reduced to the voltage level corresponding to the photo charge having the green color generated in the power supply voltage level. In the same way, a discharge path to the ground is formed through the charge transmit transistor TM 11 and the photodiode PD 3 so that the level of the shared node FN 1 is reduced to the voltage level corresponding to the photo charge having the blue color generated in the power supply voltage level.
›DETAILED DESCRIPTION · 6 of 6
A green color sensing signal and a blue color sensing signal, which are sensed by the shared nodes FN 0 and FN 1 , are amplified through the drive transistors DM 0 and DM 1 , and the amplified signals are output to the column lines CL 00 and CL 01 through the select transistors SM 0 and SM 1 as output signals 318 b and 320 b , respectively. The output signals 318 b and 320 b output to the column lines CL 00 and CL 01 are concurrently sampled in the CDS block 130 .
The above procedure may be applied to the third row and the fourth row, so that only signals generated from green pixels G 00 , G 02 , G 04 , G 06 . . . and Gn are sequentially output to the first column line CL 00 and only signals generated from blue pixels B 01 , B 03 , B 05 , B 07 . . . and Bn are sequentially output to the second column line CL 01 .
Therefore, the green colors are exclusively output to the odd column line CL 00 and the blue colors are exclusively output to the even colon line CL 01 while concurrently reading out the green color pixel row and the blue color pixel row.
Thus, the same color may be output through the same path, so that the color mismatch between rows of the same color may not occur.
In the example embodiment described with reference to FIGS. 5 and 8 , the blue color and the green color are sequentially output without the change of output sequence. Thus, different from the example embodiment described with reference to FIGS. 2 to 4 , the rearrangement of the blue color may not be necessary.
FIG. 9 is a block diagram illustrating a computing system and an interface used in the computing system according to an example embodiment.
Referring to FIG. 9 , a computing system 1000 may be implemented by a data processing device (e.g., a cellular phone, a personal digital assistant, a portable multimedia player, a smart phone, etc.) that uses or supports a mobile industry processor interface (MIPI) interface. The computing system 1000 may include an application processor 1010 , an image sensor 1040 , a display device 1050 , etc.
A CSI host 1012 of the application processor 1010 may perform a serial communication with a CSI device 1041 of the image sensor 1040 via a camera serial interface (CSI). In some example embodiments, the CSI host 1012 may include a deserializer (DES), and the CSI device 1041 may include a serializer (SER). A DSI host 1011 of the application processor 1010 may perform a serial communication with a DSI device 1051 of the display device 1050 via a display serial interface (DSI). In some example embodiments, the DSI host 1011 may include a serializer (SER), and the DSI device 1051 may include a deserializer (DES).
The computing system 1000 may further include a radio frequency (RF) chip 1060 performing a communication with the application processor 1010 . A physical layer (PHY) 1013 of the computing system 1000 and a physical layer (PHY) 1061 of the RF chip 1060 may perform data communications based on a MIPI DigRF. The application processor 1010 may further include a DigRF MASTER 1014 that controls the data communications according to the MIPI DigRF of the PHY 1061 , and the RF chip 1060 may further include a DigRF SLAVE 1062 controlled by the DigRF MASTER 1014 .
The computing system 1000 may further include a global positioning system (GPS) 1020 , a storage 1070 , a MIC 1080 , a DRAM device 1085 , and a speaker 1090 . In addition, the computing system 1000 may perform communications using an ultra wideband (UWB) 1110 , a wireless local area network (WLAN) 1100 , a worldwide interoperability for microwave access (WIMAX) 1030 , etc. However, the structure and the interface of the computing system 1000 are not limited thereto.
The foregoing is illustrative of the present inventive concepts and is not to be construed as limiting thereof. Although a few example embodiments have been described, those skilled in the art will readily appreciate that many modifications are possible in the example embodiments without materially departing from the novel teachings and advantages of the present inventive concepts. Accordingly, all such modifications are intended to be included within the scope of the present inventive concepts as defined in the claims. Therefore, it is to be understood that the foregoing is illustrative of various example embodiments and is not to be construed as limited to the specific example embodiments disclosed, and that modifications to the disclosed example embodiments, as well as other example embodiments, are intended to be included within the scope of the appended claims.
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