Image systems and scan methods

This Application claims priority of Taiwan Patent Application No. 100141749, filed on Nov. 16, 2011, the entirety of which is incorporated by reference herein.

1. Technical Field

The present technical field relates to image systems, and in particular relates to a microwave image system.

2. Description of the Related Art

Currently, radiometers for detecting microwaves are widely applied in imaging systems, such as the customs formalities or important meetings. However, gains of radiometers may drift when an integration period of scan is extended. Therefore, image systems use a calibration unit to calibrate the gains of the radiometers, which increases design complexity of image systems. In addition, radiometers use step motors to scan images, such that the radiometer stays at the corresponding pixel for an constant integration period τ to accumulate enough energy. However, the stop and the motion of stepping motors are not accurate. Therefore, there is a need for an image system to overcome the problems described above.

In light of the previously described problems, the disclosure provides an embodiment of an imaging system, including a detection unit and a scan unit. The detection unit senses radiation of a target area. The scan unit directs the radiation to the detection unit, in which the scanning unit scans the target area N times at a constant speed within a scan period, such that each of the pixels of the target area is scanned N times by the scan unit, thereby the detection unit generates N sub-detection values for each of the pixels and adds the N sub-detection values up to generate a detection value of each of the pixels.

The disclosure also provides a scan method suitable for an image system having a detection unit and a scan unit. The scan method includes the steps of: scanning a target area N times by the scan unit at a constant speed within a scan period, such that each of the pixels in the target area is scanned N times by the scan unit, thereby N sub-detection values are generated for each of the pixels; and adding up the N sub-detection values to generate a detection value for each of the pixels.

A detailed description is given in the following embodiments with reference to the accompanying drawings.

The present disclosure can be more fully understood by reading the subsequent detailed description and examples with references made to the accompanying drawings, wherein:

FIG. 1 illustrates a schematic view of an image system of the disclosure;

FIG. 2 illustrates a schematic view of the detection values and the sub-detection values of the disclosure for the illustration of the detection value corresponding to the pixel P 1 ;

FIG. 3 illustrates a schematic view of the detection values and the sub-detection values of the disclosure for the illustration of the detection value corresponding to the pixel P 2 ;

FIG. 4 illustrates a schematic view of the detection values and the sub-detection values of the disclosure for the illustration of the detection value corresponding to the pixel PM;

FIG. 5 illustrates another schematic view of the image system of the disclosure; and

FIG. 6 illustrates a flowchart of a scan method of the disclosure.

The following description is of the best-contemplated mode of carrying out the disclosure. This description is made for the purpose of illustrating the general principles of the disclosure and should not be taken in a limiting sense. The slope of the disclosure is best determined by reference to the appended claims.

FIG. 1 illustrates a schematic view of an image system of the disclosure. As shown in FIG. 1 , the image system 100 includes a detection unit 110 and a scan unit 120 . In detail, the detection unit 110 senses radiation. In the embodiments, the detection unit 110 can be a microwave radiometer. The scan unit 120 directs the radiation of a target area 150 to the detection unit 110 .

Furthermore, the scan unit 120 includes a focus unit 130 and a rotatable reflection plate 140 . The focus unit 130 can be a reflective focus unit or a refractive focus unit in order to focus radiation to the detection unit 110 . The rotatable reflective plate 140 is disposed between the detection unit 110 and the focus unit 130 to reflect radiation from the focus unit 130 to the detection unit 110 . In some embodiments, the rotatable reflective plate 140 is disposed between the target area 150 and the focus unit 130 to reflect the radiation of the target area 150 to the focus unit 130 and the detection unit 110 . The rotatable reflection plate 140 continuously rotates (or rotates at a constant speed) rather than rotates step by step. For example, the scan unit 120 scans the pixels P 1 and P 2 , or scans the pixel P 2 from the pixel P 1 by a continuous rotation (or a constant speed rotation) of the rotatable reflection plate 140 .

The scan unit 120 scans the target area ( 150 ) N times at the constant speed within a scan period, such that each of the pixels (e.g., pixel P 1 or pixel P 2 etc.) in the target area ( 150 ) is scanned N times by the detection unit 110 , thereby the detection unit 110 generates N sub-detection values for each of the pixels and adds up the N sub-detection values to generate a detection value for each of the pixels, in which the detection value is corresponding to a value of the microwave radiation irradiated from the a single pixel in the target area within the integration period.

In detail, the scan unit 120 scans a pixel P 1 in the target 150 N times, such that the detection unit 110 generates N sub-detection values and adds up the N sub-detection values to generate a detection value for pixel P 1 , in which the pixel P 1 is scanned two times within a predetermined time interval. The scan of the pixel P 1 is followed by the scan of the pixel P 2 adjacent to the pixel P 1 . Similarly, the scan unit 120 scans the pixel P 2 in the target area N times to generate N sub-detection values and adds up the N sub-detection values to generate a detection value for pixel P 2 .

All pixels in the target area 150 are scanned one time after the rotatable reflection plate 140 rotates one revolution (or a predetermined angle) at a constant speed. Therefore, the detection unit 110 can generate the detection values of the total pixels (e.g., pixels P 1 , P 2 , P 3 and P 4 etc.) in the target area 150 after the rotatable reflection plate 140 spins N revolutions, such that the image system 100 finishes the scanning of the target area 150 .

FIG. 2 illustrates a schematic view of the detection values and the sub-detection values of the disclosure for the illustration of the detection value corresponding to the pixel P 1 . As shown in FIG. 2 , the rotatable reflection plate 140 of the scan unit 120 rotates N revolutions within a scan period IT. Therefore, the image system 100 scans all pixels in the target area 150 N times, in which an interval spent on scanning the pixel P 1 two times is a predetermined time interval δT, and the scanning of the pixel P 1 is followed by the scanning of the pixel P 2 adjacent to the pixel P 1 . Therefore, the image system 100 generates sub-detection values SG 11 -SG 1 N within the scan period IT, and adds the N sub-detection values SG 11 -SG 1 N up to generate a detection value corresponding to the pixel P 1 . A period spent on scanning one pixel is an period δt, and a period spent on scanning one pixel N times is an integration period τ (i.e., τ=δt×N). In addition, the predetermined time interval δT can be an interval that the rotatable reflection plate 140 spends on rotating one revolution (or a predetermined angle).

FIG. 3 illustrates a schematic view of the detection values and the sub-detection values of the disclosure for the illustration of the detection value corresponding to the pixel P 2 . As shown in FIG. 3 , the rotatable reflection plate 140 of the scan unit 120 rotates N revolutions within a scan period IT. Therefore, the image system 100 scans the pixel P 2 in the target area 150 N times, in which a interval spent on scanning the pixel P 2 two times is the predetermined time interval δT. Therefore, the image system 100 generates sub-detection values SG 21 -SG 2 N within the scan period IT, and adds the N sub-detection values SG 21 -SG 2 N up to generate a detection value corresponding to the pixel P 2 .

FIG. 4 illustrates a schematic view of the detection values and the sub-detection values of the disclosure for the illustration of the detection value corresponding to the pixel PM. As shown in FIG. 4 , the rotatable reflection plate 140 of the scan unit 120 rotates N revolutions within the scan period IT. Therefore, the image system 100 scans the pixel PM in the target area 150 N times, in which a interval spent on scanning the pixel PM two times is the predetermined time interval δT. Therefore, the image system 100 generates sub-detection values SGM 1 -SGMN within the scan period IT, and adds the N sub-detection values SGM 1 -SGMN up to generate a detection value corresponding to the pixel PM.

A standard image system has a stepping motor to stop for the integration period τ when the pixel P 1 is scanned, such that the stepping motor scans at a non-constant speed for to accumulate enough microwave radiations. Similarly, the standard image system stops for the integration period τ to accumulate enough microwave radiations when the pixel PM is scanned. However, because the gain of the scan unit may drift, the microwave radiation values of the pixels P 1 and PM sensed by the detection unit are different even if the microwave radiations outputted by the pixels P 1 and PM are the same.

Because the image system 100 of the disclosure generates sub-detection values at different time points and the drift of the gain of the detection unit 100 is slight within the period δt, the procedure that the N sub-detection values obtained at evenly distributed time points is added up to generate a detection value can decrease the gain difference generated by the pixel scans of the image system 100 . Therefore, the image system 100 of the disclosure does not require a stepping motor or a calibration unit to overcome the gain drift of the detection unit 110 .

FIG. 5 illustrates another schematic view of the image system of the disclosure. As shown in FIG. 5 , the image system 500 of FIG. 5 is similar to the image system 100 of FIG. 1 . The difference is that the rotatable reflection plate 140 is disposed between the target area 150 and the focus unit 130 .

FIG. 6 illustrates a flowchart of a scan method of the disclosure. As shown in FIG. 6 , the scan method includes the following steps.

In step S 61 , the target area 150 is scanned N times by the scan unit 120 at a constant speed within the scan period IT, such that each of the pixels (e.g., the pixels P 1 -PM) in the target area 150 is scanned N times by the scan unit 120 , thereby N sub-detection values (e.g., SG 11 -SG 1 N or SG(M−1)-SG(M−1)N) are generated for each of the pixels (e.g., the pixel P 1 or P(M−1)).

In step S 62 , the N sub-detection values (e.g., SG 11 -SG 1 N or SG(M−1)-SG(M−1)N) are added up to generate a detection value for each of the pixels (e.g., the pixel P 1 or P(M−1)). Therefore, the detection value (i.e., the radiation value) generated by the scan method has solved the problem with the gain drift of the detection unit, such that there is no need to perform additional calibration procedures.

The foregoing has outlined features of several embodiments so that those skilled in the art may better understand the disclosure. Those skilled in the art should appreciate that they may readily use the present disclosure as a basis for designing or modifying other processes and structures for carrying out the same purposes and/or achieving the same advantages of the embodiments introduced herein. Those skilled in the art should also realize that such equivalent constructions do not depart from the spirit and slope of the present disclosure, and that they may make various changes, substitutions and alterations herein without departing from the spirit and scope of the present disclosure.