Contactor for semiconductor IC testers

FIG. 1 is a perspective view of another embodiment of FIG. 1;

FIG. 2 is a top plan view in a reduced scale of FIG. 1;

FIG. 3 is a bottom plan in a reduced scale of FIG. 1;

FIG. 4 is a front elevational view in a reduced scale of FIG. 1, the rear elevational view being a mirror image of the front elevational view;

FIG. 5 is a left side elevational view in a reduced scale of FIG. 1, the right side elevational view being a mirror image of the left side view; and,

FIG. 6 is a center horizontal cross-sectional view in an enlarged scale of FIG. 2.