Inventor
Yuri Alexeyevich Plotnikov
Inventor
Niskayuna, NY, US
Overview
Patents· 30 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties44%
B61LGuiding railway traffic19%
E21BEarth or rock drilling8%
G01RMeasuring electric variables6%
G01VGeophysics6%
G06TImage data processing or generation, in general6%
Y10TTechnical subjects covered by former us classification6%
G01BMeasuring length, thickness or similar linear dimensions3%
G06FElectric digital data processing3%
PatentTitleYear
10,884,158Multi-barrier wellbore integrity inspection system with eccentricity correction202110,501,100Route examining system201910,167,005Route examining system and method201910,152,784System and method for detecting defects in a component20189,834,237Route examining system and method20179,802,631'Route examining system'20179,746,583'Gas well integrity inspection system'20179,669,851'Route examination system and method'20179,638,648'Flaw detection using transient thermography'20179,481,384'Route examining system and method'20169,435,766'System and method for inspection of components'20169,416,652'Sensing magnetized portions of a wellhead system to monitor fatigue loading'20169,416,649'Method and system for determination of pipe location in blowout preventers'20169,244,049'System and method for detection of nutritional parameters in food items'20168,914,171'Route examining system and method'20148,884,614'Eddy current array probe'20148,761,438'Systems and methods for object imaging'20148,436,608'Eddy current inspection system and method'20137,952,348'Flexible eddy current array probe and methods of assembling the same'20117,911,205'Electromagnetic resonance frequency inspection systems and methods'20117,888,932'Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same'20117,830,140'Eddy current system and method for estimating material properties of parts'20107,402,999'Pulsed eddy current pipeline inspection system and method'20087,389,206'Inspection systems and methods of operation'20087,154,265'Eddy current probe and inspection method'20067,015,690'Omnidirectional eddy current probe and inspection system'20067,005,851'Methods and apparatus for inspection utilizing pulsed eddy current'20066,911,826'Pulsed eddy current sensor probes and inspection methods'20056,720,775'Pulsed eddy current two-dimensional sensor array inspection probe and system'20046,707,297'Method for in-situ eddy current inspection of coated components in turbine engines'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2019Patents assigned to GEN ELECTRIC (27)· patent assignee history
2004–2019Based in Niskayuna, NY, US· patent location history
2004Based in Clifton Park, NY, US· patent location history
2013–2017Patents assigned to PLOTNIKOV YURI ALEXEYEVICH (4)· patent assignee history
2013–2014Patents assigned to SHEILA-VADDE APARNA CHAKRAPANI (2)· patent assignee history
2013–2014Patents assigned to WANG CHANGTING (2)· patent assignee history
2017Based in Schenectady, NY, US· patent location history
2021Patents assigned to GE ENERGY OILFIELD TECH INC (1)· patent assignee history
2021Based in Chesterfield, VA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GEN ELECTRIC | 27 | 2004–2019 |
| PLOTNIKOV YURI ALEXEYEVICHself | 4 | 2013–2017 |
| SHEILA-VADDE APARNA CHAKRAPANI | 2 | 2013–2014 |
| WANG CHANGTING | 2 | 2013–2014 |
| GE ENERGY OILFIELD TECH INC | 1 | 2021 |
Locations
| Location | Patents | Span |
|---|---|---|
| Niskayuna, New York, US | 27 | 2004–2019 |
| Chesterfield, Virginia, US | 1 | 2021 |
| Schenectady, New York, US | 1 | 2017 |
| Clifton Park, New York, US | 1 | 2004 |