Inventor
Robert S. Gilmore
Inventor
Burnt Hills, NY, US
Overview
Patents· 34 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties33%
G10KSound-producing devices8%
B29CShaping or joining of plastics5%
G01SRadio direction-finding5%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution5%
B06BMethods or apparatus for generating or transmitting mechanical vibrations of infrasonic, sonic, or ultrasonic frequency, e.g. for performing mechanical work in general3%
G01TMeasurement of nuclear or x-radiation3%
G21CNuclear reactors3%
H10NElectric solid-state devices not otherwise provided for3%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests3%
PatentTitleYear
7,263,888'Two dimensional phased arrays for volumetric ultrasonic inspection and methods of use'20076,988,410'Inspection method and apparatus for determining incipient mechanical failure'20066,977,015'Apparatus and method for cleaning internal channels of an article'20056,951,132'Rail and train monitoring system and method'20056,789,427'Phased array ultrasonic inspection method for industrial applications'20046,742,392'Method and apparatus for inducing ultrasonic waves into railroad rails'20046,670,577'Laser shock peening method and apparatus'20036,596,099'Titanium articles and structures for ultrasonic inspection methods and systems'20036,415,665'Ultrasonic probe and method for monitoring materials processing in screw driven extruders'20026,408,695'Ultrasonic inspection method and system for detecting critical flaws'20026,401,537'Titanium-based alloys having improved inspection characteristics for ultrasonic examination, and related processes'20026,393,916'Ultrasonic inspection method and system'20026,370,956'Titanium articles and structures for ultrasonic inspection methods and systems'20025,974,886'Method and apparatus for thickness determination in multilayer articles'19995,955,671'Method and apparatus for measurement of orientation in an anisotropic medium'19995,631,424'Method for ultrasonic evaluation of materials using time of flight measurements'19975,608,814'Method of dynamic thresholding for flaw detection in ultrasonic C-scan images'19975,568,144'Method for improving waveform digitization and circuit for implementing said method'19965,533,401'Multizone ultrasonic inspection method and apparatus'19965,519,225'System and method for using a dual modality detector for inspecting objects'19965,510,709'Eddy current surface inspection probe for aircraft fastener inspection, and inspection method'19965,489,781'Dual modality detector'19965,445,688'Method of making alloy standards having controlled inclusions'19955,408,882'Ultrasonic device and method for non-destructive evaluation of polymer composites'19955,363,556'Water jet mixing tubes used in water jet cutting devices and method of preparation thereof'19945,108,693'Non-destructive dimensional and flaw inspection of thin wall tube weldments'19925,063,779'Non-destructive dimensional and flaw inspection of thin wall tube weldments'19914,939,101'Method of making direct bonded wafers having a void free interface'19904,921,415'Cure monitoring apparatus having high temperature ultrasonic transducers'19904,911,170'High frequency focused ultrasonic transducer for invasive tissue characterization'19904,825,117'Temperature compensated piezoelectric transducer assembly'19894,366,713'Ultrasonic bond testing of semiconductor devices'19834,361,717'Fluid cooled solar powered photovoltaic cell'19823,934,460'Apparatus for focusing and collimating ultrasonic waves'1976Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1976–2007Patents assigned to GEN ELECTRIC (34)· patent assignee history
1976–2005Based in Burnt Hills, NY, US· patent location history
2002–2007Based in Charlton, NY, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GEN ELECTRIC | 34 | 1976–2007 |
Locations
| Location | Patents | Span |
|---|---|---|
| Burnt Hills, New York, US | 24 | 1976–2005 |
| Charlton, New York, US | 10 | 2002–2007 |