Inventor
Benjamin J. Brown
Inventor
Keene, NH, US
Overview
Patents· 26 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables32%
C09DCoating compositions, e.g. paints, varnishes or lacquers17%
G06FElectric digital data processing10%
G11CStatic stores7%
H04LTransmission of digital information, e.g. telegraphic communication7%
G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes5%
H04QSelecting5%
B41MPrinting, duplicating, marking, or copying processes2%
B65DContainers for storage or transport of articles or materials, e.g. bags, barrels, bottles, boxes, cans, cartons, crates, drums, jars, tanks, hoppers, forwarding containers2%
D06PDyeing or printing textiles2%
PatentTitleYear
10,444,278Testing system and method201910,379,154Testing system and method20199,957,401Solvent-based inkjet ink formulations20189,296,910'Inkjet ink formulations'20169,284,463'Solvent-based inkjet ink formulations'20168,778,074'Solvent-based inkjet ink formulations'20148,738,473'Inventory filtering system, method, and computer program product'20148,500,895'Methods of marking and related structures and compositions'20138,285,608'Inventory filtering system, method, and computer program product'20127,660,528'Method and system for mitigating Raman crosstalk in an Ethernet passive optical network'20106,990,423'Apparatus and method for testing non-deterministic device data'20066,778,526'High speed access bus interface and protocol'20046,702,884'Pigmented hot melt inks'20046,609,077'ATE timing measurement unit and method'20036,360,340'Memory tester with data compression'20026,317,427'Method and apparatus for adaptive port buffering'20016,286,120'Memory architecture for automatic test equipment using vector module table'20015,923,675'Semiconductor tester for testing devices with embedded memory'19995,888,287'Washable fabrics ink'19995,570,383'Timing hazard detector accelerator'19965,566,188'Low cost timing generator for automatic test equipment operating at high data rates'19965,440,691'System for minimizing underflowing transmit buffer and overflowing receive buffer by giving highest priority for storage device access'19955,321,702'High speed timing generator'19945,321,700'High speed timing generator'19945,280,486'High speed fail processor'19945,270,582'High speed timing generator'1993Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1993–2006Patents assigned to TERADYNE INC (11)· patent assignee history
1993–2001Based in Westlake Village, CA, US· patent location history
1995–2010Based in Chichester, NH, US· patent location history
1999–2018Based in Keene, NH, US· patent location history
1999–2006Based in Lake Oswego, OR, US· patent location history
2012–2014Patents assigned to BROWN BENJAMIN (2)· patent assignee history
2012–2014Patents assigned to GIBSON DAVID M (2)· patent assignee history
2013–2018Patents assigned to MARKEM IMAJE CORP (5)· patent assignee history
2013–2014Patents assigned to BROWN BENJAMIN J (2)· patent assignee history
2019Based in Palo Alto, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TERADYNE INC | 11 | 1993–2006 |
| MARKEM IMAJE CORP | 5 | 2013–2018 |
| BROWN BENJAMINself | 2 | 2012–2014 |
| BROWN BENJAMIN Jself | 2 | 2013–2014 |
| GIBSON DAVID M | 2 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Keene, NH, US | 7 | 1999–2018 |
| Westlake Village, California, US | 7 | 1993–2001 |
| Chichester, NH, US | 4 | 1995–2010 |
| Lake Oswego, OR, US | 4 | 1999–2006 |
| Palo Alto, California, US | 2 | 2019 |