Inventor
Idaku Ishii
Inventor
Koganei, JP
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Jprimary
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light43%
H04NPictorial communication, e.g. television43%
G06TImage data processing or generation, in general14%
PatentTitleYear
8,244,788'Semiconductor integrated circuit device having a plurality of photo detectors and processing elements'20127,244,919'Semiconductor integrated circuit device having photo detector circuits, processing elements, and comparing circuits which compare the output of a photo detector element with a reference voltage'20077,098,437'Semiconductor integrated circuit device having a plurality of photo detectors and processing elements'20067,046,821'Image detection processor'2006Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2006–2012Patents assigned to SEMICONDUCTOR TECH ACAD RES CT (3)· patent assignee history
2006–2012Based in Koganei, JP· patent location history
2006Based in Tokyo, JP· patent location history
2012Patents assigned to ISHII IDAKU (1)· patent assignee history
2012Patents assigned to ISHIKAWA MASATOSHI (1)· patent assignee history
2012Patents assigned to KAGAMI SHINGO (1)· patent assignee history
2012Patents assigned to KOMURO TAKASHI (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SEMICONDUCTOR TECH ACAD RES CT | 3 | 2006–2012 |
| ISHII IDAKUself | 1 | 2012 |
| ISHIKAWA MASATOSHI | 1 | 2012 |
| KAGAMI SHINGO | 1 | 2012 |
| KOMURO TAKASHI | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Koganei, JP | 3 | 2006–2012 |
| Tokyo, JP | 1 | 2006 |