Inventor
Cheng Ni
Inventor
Shenzhen, CN
Overview
Patents· 24 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables56%
A61BDiagnosis17%
A61NElectrotherapy11%
G01NInvestigating or analysing materials by determining their chemical or physical properties6%
G06TImage data processing or generation, in general6%
G01KMeasuring temperature3%
H01RElectrically-conductive connections3%
PatentTitleYear
11,071,877Systems and methods for generating radiation treatment plan202110,561,859Therapeutic system and method202010,433,810Imaging system calibration20199,693,749'Imaging system calibration'20178,638,099'Method for reducing magnetic resonance temperature measurement errors in a magnetic resonance monitored HIFU treatment'20148,638,101'Method and apparatus for compensating insufficient homogeneity of the basic magnetic field in a magnetic resonance apparatus'20148,476,904'Method for magnetic resonance imaging'20138,401,614'Magnetic resonance thermometry method'20138,248,090'ZIF connectors and semiconductor testing device and system using the same'20128,115,580'Magnetic field adjusting device'20128,030,944'Method for continuity test of integrated circuit'20118,008,938'Testing system module'20117,821,277'Parallel test fixture for mixed signal integrated circuits'20107,804,315'Probe card'20107,786,744'Probe card assembly and test probes therein'20107,772,861'Probe card'20107,710,134'Probe card assembly'20107,633,292'Method of reducing eddy currents caused by a gradient magnetic field in a magnetic resonance system'20097,629,803'Probe card assembly and test probes therein'20097,541,904'Magnetic field adjusting device'20097,518,366'Method for testing magnetic field distribution and apparatus therefor'20097,323,875'Shimming structure and method for a magnetic resonance imaging apparatus'20087,218,114'Shimmed magnetic resonance imaging apparatus and shimming method therefor'20076,218,839'Magnetic resonance imaging systems'2001Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2001Based in Coventry, GB· patent location history
2007–2014Patents assigned to SIEMENS AG (10)· patent assignee history
2007–2014Based in Shenzhen, CN· patent location history
2009–2012Patents assigned to KING YUAN ELECTRONICS CO LTD (9)· patent assignee history
2009–2012Based in Hsinchu, TW· patent location history
2010–2011Based in Taipei, TW· patent location history
2012–2014Patents assigned to NI CHENG (5)· patent assignee history
2013–2014Patents assigned to ZHOU XIAO DONG (3)· patent assignee history
2017–2021Patents assigned to SHANGHAI UNITED IMAGING HEALTHCARE CO LTD (4)· patent assignee history
2017–2021Based in Shanghai, CN· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SIEMENS AG | 10 | 2007–2014 |
| KING YUAN ELECTRONICS CO LTD | 9 | 2009–2012 |
| NI CHENGself | 5 | 2012–2014 |
| SHANGHAI UNITED IMAGING HEALTHCARE CO LTD | 4 | 2017–2021 |
| ZHOU XIAO DONG | 3 | 2013–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Shenzhen, CN | 10 | 2007–2014 |
| Hsinchu, TW | 7 | 2009–2012 |
| Shanghai, CN | 4 | 2017–2021 |
| Taipei, TW | 2 | 2010–2011 |
| Coventry, GB | 1 | 2001 |