Inventor
AMI SADE
Inventor
US
Overview
Patents· 1 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions33%
G01NInvestigating or analysing materials by determining their chemical or physical properties33%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1033%
PatentTitleYear
11,204,312In-situ full wafer metrology system2021Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2021Patents assigned to APPLIED MATERIALS INC (1)· patent assignee history
2021Based in US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| APPLIED MATERIALS INC | 1 | 2021 |
Locations
| Location | Patents | Span |
|---|---|---|
| US | 1 | 2021 |