Inventor
Renn-Shyan Yeh
Inventor
Taichun, TW
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Pprimary
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1043%
G01NInvestigating or analysing materials by determining their chemical or physical properties29%
G01MTesting static or dynamic balance of machines or structures14%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1014%
PatentTitleYear
6,389,323'Method and system for yield loss analysis by yield management system'20026,308,576'Method for determining stress effect on a film during scrubber clean'20016,153,497'Method for determining a cause for defects in a film deposited on a wafer'20006,017,771'Method and system for yield loss analysis by yield management system'2000Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2000–2002Patents assigned to TAIWAN SEMICONDUCTOR MFG (4)· patent assignee history
2000–2002Based in Taichun, TW· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TAIWAN SEMICONDUCTOR MFG | 4 | 2000–2002 |
Locations
| Location | Patents | Span |
|---|---|---|
| Taichun, TW | 4 | 2000–2002 |