Inventor
Edward Raymond Dowski, Jr.
Inventor
Lafayette, CO, US
Overview
Patents· 62 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus34%
H04NPictorial communication, e.g. television14%
G01SRadio direction-finding9%
G06TImage data processing or generation, in general8%
G06VImage or video recognition or understanding6%
G06FElectric digital data processing4%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation4%
A61BDiagnosis3%
G01CMeasuring distances, levels or bearings3%
G05DSystems for controlling or regulating non-electric variables3%
PatentTitleYear
11,092,662Optical guidance systems and methods using mutually distinct signal-modifying sensors202111,009,584Localization system and associated method202110,126,114Angular localization system, associated repositionable mechanical structure, and associated method201810,024,651Coded localization systems, methods and apparatus201810,002,215Arrayed imaging systems having improved alignment and associated methods20189,912,913'Encapsulated image acquisition devices having on-board data storage, and systems, kits, and methods therefor'20189,819,908'Encapsulated image acquisition devices having on-board data storage, and systems, kits, and methods therefor'20179,807,347'Encapsulated image acquisition devices having on-board data storage, and systems, kits, and methods therefor'20179,739,864'Optical guidance systems and methods using mutually distinct signal-modifying'20179,534,884'Coded localization systems, methods and apparatus'20179,471,994'Image based systems for detecting information on moving objects'20169,418,193'Arrayed imaging systems having improved alignment and associated methods'20168,760,516'Task-based imaging systems'20148,736,699'Multi-region imaging systems'20148,717,456'Optical imaging systems and methods utilizing nonlinear and/or spatially varying image processing'20148,599,301'Arrayed imaging systems having improved alignment and associated methods'20138,593,552'Image based systems for detecting information on moving objects'20138,563,913'Imaging systems having ray corrector, and associated methods'20138,532,349'Encapsulated image acquisition devices having on-board data storage, and systems, kits, and methods therefor'20138,426,789'Aspheric lens forming methods'20138,164,040'Saturation optics'20128,144,208'Task-based imaging systems'20128,111,937'Optimized image processing for wavefront coded imaging systems'20128,107,705'Systems and methods for minimizing aberrating effects in imaging systems'20128,068,163'Optical imaging systems and methods utilizing nonlinear and/or spatially varying image processing'20118,004,762'Extended depth of field optical systems'20117,995,853'Optimized image processing for wavefront coded imaging systems'20117,944,467'Task-based imaging systems'20117,911,501'Optical imaging systems and methods utilizing nonlinear and/or spatially varying image processing'20117,889,903'Systems and methods for minimizing aberrating effects in imaging systems'20117,876,417'Lithographic systems and methods with extended depth of focus'20117,860,699'System and method for optimizing optical and digital system designs'20107,732,750'Wavefront coding interference contrast imaging systems'20107,710,658'Zoom lens systems with wavefront coding'20107,679,830'Optical systems utilizing multiple phase filters to increase misfocus tolerance'20107,583,442'Extended depth of field optical systems'20097,554,731'Wavefront coded imaging systems'20097,554,732'Wavefront coded imaging systems'20097,469,202'System and method for optimizing optical and digital system designs'20087,453,653'Low height imaging system and associated methods'20087,450,745'Systems and methods for minimizing aberrating effects in imaging systems'20087,436,595'Extended depth of field optical systems'20087,379,613'Optimized image processing for wavefront coded imaging systems'20087,319,783'Methods for minimizing aberrating effects in imaging systems'20087,260,251'Systems and methods for minimizing aberrating effects in imaging systems'20077,218,448'Extended depth of field optical systems'20077,180,673'Mechanically-adjustable optical phase filters for modifying depth of field, aberration-tolerance, anti-aliasing in optical systems'20077,115,849'Wavefront coding interference contrast imaging systems'20067,106,510'Wavefront coded imaging systems'20067,088,419'Lithographic systems and methods with extended depth of focus'20067,031,054'Methods and systems for reducing depth of field of hybrid imaging systems'20066,940,649'Wavefront coded imaging systems'20056,911,638'Wavefront coding zoom lens imaging systems'20056,873,733'Combined wavefront coding and amplitude contrast imaging systems'20056,842,297'Wavefront coding optics'20056,525,302'Wavefront coding phase contrast imaging systems'20036,069,738'Apparatus and methods for extending depth of field in image projection systems'20006,021,005'Anti-aliasing apparatus and methods for optical imaging'20005,870,179'Apparatus and method for estimating range'19995,748,371'Extended depth of field optical systems'19985,521,695'Range estimation apparatus and method'19965,227,890'Automatic focusing device which focuses a lens based on a Z-transformation polynomial'1993Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1993Based in Portsmouth, RI, US· patent location history
1996–2010Patents assigned to UNIV COLORADO (12)· patent assignee history
1996–2018Based in Lafayette, CO, US· patent location history
2008–2010Patents assigned to OMNIVISION CDM OPTICS INC (8)· patent assignee history
2010–2018Patents assigned to OMNIVISION TECH INC (25)· patent assignee history
2011–2014Patents assigned to DOWSKI JR EDWARD R (11)· patent assignee history
2017–2021Patents assigned to ASCENTIA IMAGING INC (6)· patent assignee history
2018–2021Based in Steamboat Springs, CO, US· patent location history
2021Based in Lafayette, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| OMNIVISION TECH INC | 25 | 2010–2018 |
| UNIV COLORADO | 12 | 1996–2010 |
| DOWSKI JR EDWARD Rself | 11 | 2011–2014 |
| OMNIVISION CDM OPTICS INC | 8 | 2008–2010 |
| ASCENTIA IMAGING INC | 6 | 2017–2021 |
Locations
| Location | Patents | Span |
|---|---|---|
| Lafayette, CO, US | 57 | 1996–2018 |
| Steamboat Springs, CO, US | 3 | 2018–2021 |
| Lafayette, California, US | 1 | 2021 |
| Portsmouth, RI, US | 1 | 1993 |