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Inventor

Mohamed M. Hafed

Inventor
Montreal, CA

Overview

9→
Patents
2005–2012
Patent span
Physics
Primary field (CPC G)

Patents· 9 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables73%
H04BTransmission18%
G06FElectric digital data processing9%
PatentTitleYear
8,327,204'High-speed transceiver tester incorporating jitter injection'20128,244,492'Methods of parametric testing in digital circuits'20127,917,319'Systems and methods for testing and diagnosing delay faults and for parametric testing in digital circuits'20117,813,297'High-speed signal testing system having oscilloscope functionality'20107,681,091'Signal integrity measurement systems and methods using a predominantly digital time-base generator'20107,315,574'System and method for generating a jittered test signal'20087,242,209'System and method for testing integrated circuits'20076,931,579'Integrated excitation/extraction system for test and measurement'20056,914,548'Programmable DC voltage generator'2005

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2005Patents assigned to UNIV MCGILL (2)· patent assignee history
2005–2012Based in Montreal, CA· patent location history
2007–2012Patents assigned to DFT MICROSYSTEMS INC (7)· patent assignee history
2012Patents assigned to HAFED MOHAMED M (2)· patent assignee history
2012Patents assigned to LABERGE SEBASTIEN (1)· patent assignee history
2012Patents assigned to PISHDAD BARDIA (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
DFT MICROSYSTEMS INC72007–2012
HAFED MOHAMED Mself22012
UNIV MCGILL22005
LABERGE SEBASTIEN12012
PISHDAD BARDIA12012
Locations
LocationPatentsSpan
Montreal, CA92005–2012