Inventor
YOHEI MINEKAWA
Inventor
JP
Overview
Patents· 7 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Tprimary
G06TImage data processing or generation, in general26%
G01NInvestigating or analysing materials by determining their chemical or physical properties19%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1015%
G06VImage or video recognition or understanding11%
H01JElectric discharge tubes or discharge lamps11%
G06NComputing arrangements based on specific computational models7%
G01BMeasuring length, thickness or similar linear dimensions4%
G06FElectric digital data processing4%
H01LSemiconductor devices4%
PatentTitleYear
12,511,729Defect classification device and defect classification program202512,333,695Sample observation system and image processing method202512,260,545Sample observation device and method202512,154,264Defect inspecting system and defect inspecting method202411,670,528Wafer observation apparatus and wafer observation method202311,501,950Charged particle beam device202211,177,111Defect observation device2021Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2021–2025Patents assigned to HITACHI HIGH TECH CORP (7)· patent assignee history
2021–2025Based in JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 7 | 2021–2025 |
Locations
| Location | Patents | Span |
|---|---|---|
| JP | 7 | 2021–2025 |