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Inventor

Dan Engelhard

Inventor
Mountain View, CA, US

Overview

3→
Patents
2006–2008
Patent span
Physics
Primary field (CPC G)

Patents· 3 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions50%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices50%
PatentTitleYear
7,395,132'Optical metrology model optimization for process control'20087,221,989'Optical metrology model optimization for process control'20077,065,423'Optical metrology model optimization for process control'2006

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2006–2008Patents assigned to TIMBRE TECH INC (2)· patent assignee history
2006–2008Based in Mountain View, CA, US· patent location history
2007Patents assigned to TOKYO ELECTRON LTD (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TIMBRE TECH INC22006–2008
TOKYO ELECTRON LTD12007
Locations
LocationPatentsSpan
Mountain View, California, US32006–2008