Inventor
SAMER KABBANI
Inventor
US
Overview
Patents· 36 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables53%
H10NElectric solid-state devices not otherwise provided for9%
F28FDetails of heat-exchange and heat-transfer apparatus, of general application7%
H01LSemiconductor devices7%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h107%
G05BControl or regulating systems in general4%
G11CStatic stores4%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h104%
G01KMeasuring temperature1%
H05BElectric heating1%
PatentTitleYear
12,540,967Wafer scale active thermal interposer for device testing202612,540,968Wafer scale active thermal interposer for device testing202612,535,522Wafer scale active thermal interposer for device testing202612,374,420Carrier based high volume system level testing of devices with pop structures202512,345,756Integrated test cell using active thermal interposer (ATI) with parallel socket actuation202512,320,841Wafer scale active thermal interposer for device testing202512,320,852Passive carrier-based device delivery for slot-based high-volume semiconductor test system202512,259,428Multiplexed thermal control wafer and coldplate202512,259,427Thermal head comprising a plurality of adapters for independent thermal control of zones202512,216,154Active thermal interposer device202512,203,958Shielded socket and carrier for high-volume test of semiconductor devices202512,203,979Multi-input multi-zone thermal control for device testing202512,085,609Thermal control wafer with integrated heating-sensing elements202412,013,432Thermal control wafer with integrated heating-sensing elements202412,000,885Multiplexed thermal control wafer and coldplate202411,940,487Thermal solution for massively parallel testing202411,852,678Multi-input multi-zone thermal control for device testing202311,846,669Active thermal interposer device202311,841,392Integrated test cell using active thermal interposer (ATI) with parallel socket actuation202311,828,795Test system with a thermal head comprising a plurality of adapters for independent thermal control of zones202311,821,913Shielded socket and carrier for high-volume test of semiconductor devices202311,808,812Passive carrier-based device delivery for slot-based high-volume semiconductor test system202311,796,589Thermal head for independent control of zones202311,774,492Test system including active thermal interposer device202311,754,620DUT placement and handling for active thermal interposer device202311,742,055Carrier based high volume system level testing of devices with pop structures202311,693,051Thermal head for independent control of zones202311,674,999Wafer scale active thermal interposer for device testing202311,656,272Test system with a thermal head comprising a plurality of adapters and one or more cold plates for independent control of zones202311,656,273High current device testing apparatus and systems202311,609,266Active thermal interposer device202311,587,640Carrier based high volume system level testing of devices with pop structures202311,573,262Multi-input multi-zone thermal control for device testing202311,567,119Testing system including active thermal interposer device202311,549,981Thermal solution for massively parallel testing202311,493,551Integrated test cell using active thermal interposer (ATI) with parallel socket actuation2022Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2022–2026Patents assigned to ADVANTEST TEST SOLUTIONS INC (27)· patent assignee history
2022–2026Based in US· patent location history
2023Patents assigned to AEM HOLDINGS LTD (4)· patent assignee history
2023Patents assigned to ADVANTEST TEST SOLUTIIONS INC (1)· patent assignee history
2024–2025Patents assigned to AEM SINGAPORE PTE LTD (5)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ADVANTEST TEST SOLUTIONS INC | 27 | 2022–2026 |
| AEM SINGAPORE PTE LTD | 5 | 2024–2025 |
| AEM HOLDINGS LTD | 4 | 2023 |
| ADVANTEST TEST SOLUTIIONS INC | 1 | 2023 |
Locations
| Location | Patents | Span |
|---|---|---|
| US | 36 | 2022–2026 |