Inventor
Sun Whan Kim
Inventor
Yongin-si, KR
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables40%
G06FElectric digital data processing20%
G11CStatic stores20%
A47CChairs10%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1010%
PatentTitleYear
7,688,099'Sequential semiconductor device tester'20107,652,497'Sequential semiconductor device tester'20107,607,056'Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices'20097,416,253'Seat apparatus having variable gap'20087,288,949'Semiconductor test interface'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007–2010Patents assigned to UNITEST INC (4)· patent assignee history
2007–2009Based in Yongin, KR· patent location history
2008Patents assigned to KIM SUN WHAN (1)· patent assignee history
2008–2010Based in Yongin-si, KR· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| UNITEST INC | 4 | 2007–2010 |
| KIM SUN WHANself | 1 | 2008 |
Locations
| Location | Patents | Span |
|---|---|---|
| Yongin-si, KR | 3 | 2008–2010 |
| Yongin, KR | 2 | 2007–2009 |