Inventor

Werner Hickel

Inventor

Ludwigshafen, DE

Overview

14→

Patents

1991–1998

Patent span

Performing operations

Primary field (CPC B)

Patents· 14 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

B82Yprimary

B82YSpecific uses or applications of nanostructures19%

B05DProcesses for applying fluent materials to surfaces, in general14%

G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein14%

Y10TTechnical subjects covered by former us classification14%

Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests7%

B01DSeparation5%

C07DHeterocyclic compounds5%

C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients5%

G01BMeasuring length, thickness or similar linear dimensions5%

G01NInvestigating or analysing materials by determining their chemical or physical properties5%

PatentTitleYear

5,733,663'Composite membrane and process for its production'1998 5,684,165'Substituted thieno›3,2b!thiophenes and their use'1997 5,658,669'Composite membranes and processes for their production'1997 5,654,092'Layer element containing at least one monomolecular layer of a mixture of a fullerene and an amphiphilic molecule'1997 5,580,612'Process for production of layer element containing at least one monomolecular layer of an amphiphilic molecule and one fullerene'1996 5,517,350'Optical component based on Langmuir-Blodgett layers'1996 5,432,286'Substituted thieno[3,2-b]thiophenes and their use'1995 5,429,842'Process and device for producing ultrathin layers and layer element'1995 5,402,262'Layer element having a plurality of monomolecular layers'1995 5,256,749'Amphiphilic polymers containing silane units and film comprising at least one monomolecular layer produced therefrom'1993 5,237,392'Determination of refractive index and thickness of thin layers'1993 5,141,311'Examination of the physical properties of thin films'1992 5,049,462'Reading out information stored in thin polymer layers'1991 5,028,132'Examination of surface structure'1991

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1991–1993Patents assigned to BASF AG (4)· patent assignee history

1991–1993Based in Mannheim, DE· patent location history

1993–1998Patents assigned to HOECHST AG (10)· patent assignee history

1995–1998Based in Ludwigshafen, DE· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
HOECHST AG	10	1993–1998
BASF AG	4	1991–1993

Locations

Location	Patents	Span
Ludwigshafen, DE	9	1995–1998
Mannheim, DE	5	1991–1993