Inventor

Masato Iyoki

Inventor

Chiba, JP

Overview

2001–2014

Patent span

Physics

Primary field (CPC G)

Patents· 18 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Qprimary

G01QScanning-probe techniques or apparatus42%

B82YSpecific uses or applications of nanostructures28%

G01BMeasuring length, thickness or similar linear dimensions7%

Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests7%

G01NInvestigating or analysing materials by determining their chemical or physical properties5%

H10NElectric solid-state devices not otherwise provided for5%

G01GWeighing2%

G02BOptical elements, systems or apparatus2%

H01JElectric discharge tubes or discharge lamps2%

PatentTitleYear

8,813,261'Scanning probe microscope'2014 8,601,608'Cantilever for scanning probe microscope and scanning probe microscope equipped with it'2013 8,214,915'Cantilever, cantilever system, scanning probe microscope, mass sensor apparatus, viscoelasticity measuring instrument, manipulation apparatus, displacement determination method of cantilever, vibration method of cantilever and deformation method of cantilever'2012 8,161,568'Self displacement sensing cantilever and scanning probe microscope'2012 8,115,367'Piezoelectric actuator provided with a displacement meter, piezoelectric element, and positioning device'2012 8,058,780'Circular cylinder type piezoelectric actuator and piezoelectric element and scanning probe microscope using those'2011 8,024,816'Approach method for probe and sample in scanning probe microscope'2011 7,973,942'Optical displacement detection mechanism and surface information measurement device using the same'2011 7,945,965'Sensor for observations in liquid environments and observation apparatus for use in liquid environments'2011 7,787,133'Optical displacement-detecting mechanism and probe microscope using the same'2010 7,614,287'Scanning probe microscope displacement detecting mechanism and scanning probe microscope using same'2009 7,614,288'Scanning probe microscope fine-movement mechanism and scanning probe microscope using same'2009 7,605,368'Vibration-type cantilever holder and scanning probe microscope'2009 7,288,762'Fine-adjustment mechanism for scanning probe microscopy'2007 7,282,157'Method of manufacturing light-propagating probe for near-field microscope'2007 7,241,987'Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe'2007 7,170,054'Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holder'2007 6,257,053'Scanning probe microscope having piezoelectric member for controlling movement of probe'2001

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2001–2013Based in Chiba, JP· patent location history

2007–2013Patents assigned to SII NANOTECHNOLOGY INC (16)· patent assignee history

2011–2013Patents assigned to IYOKI MASATO (5)· patent assignee history

2012Patents assigned to WATANABE NAOYA (2)· patent assignee history

2013Patents assigned to JAPAN SCIENCE & TECH AGENCY (1)· patent assignee history

2014Patents assigned to HITACHI HIGH TECH SCIENCE CORP (1)· patent assignee history

2014Based in Minato-ku, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
SII NANOTECHNOLOGY INC	16	2007–2013
IYOKI MASATOself	5	2011–2013
WATANABE NAOYA	2	2012
HITACHI HIGH TECH SCIENCE CORP	1	2014
JAPAN SCIENCE & TECH AGENCY	1	2013

Locations

Location	Patents	Span
Chiba, JP	17	2001–2013
Minato-ku, JP	1	2014