Inventor
Kenichi Yasuzawa
Inventor
Tokyo, JP
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties63%
B01FMixing, e.g. dissolving, emulsifying or dispersing13%
G05BControl or regulating systems in general13%
Y10TTechnical subjects covered by former us classification13%
PatentTitleYear
10,816,564Sample test automation system202010,768,187Automatic analysis device and specimen inspection automation system20209,952,239Sample inspection automation system and sample transfer method20189,753,048'Sample test automation system'20179,645,161'Sample inspection automation system'2017Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2017–2020Patents assigned to HITACHI HIGH TECH CORP (5)· patent assignee history
2017Patents assigned to YASUZAWA KENICHI (2)· patent assignee history
2017Patents assigned to AKUTSU MASASHI (1)· patent assignee history
2017Patents assigned to FUKUGAKI TATSUYA (1)· patent assignee history
2017Patents assigned to HANAWA MASAAKI (1)· patent assignee history
2017–2020Based in Tokyo, JP· patent location history
2017–2020Based in Hitachinaka, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 5 | 2017–2020 |
| YASUZAWA KENICHIself | 2 | 2017 |
| AKUTSU MASASHI | 1 | 2017 |
| FUKUGAKI TATSUYA | 1 | 2017 |
| HANAWA MASAAKI | 1 | 2017 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 3 | 2017–2020 |
| Hitachinaka, JP | 2 | 2017–2020 |