Inventor
De-Wei Yu
Inventor
Pingtung County, TW
Overview
Patents· 30 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Pprimary
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1030%
H10DInorganic electric semiconductor devices27%
H01LSemiconductor devices26%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1010%
G01BMeasuring length, thickness or similar linear dimensions3%
G01NInvestigating or analysing materials by determining their chemical or physical properties3%
C23CCoating metallic material2%
PatentTitleYear
10,868,140Gap-filling germanium through selective bottom-up growth202010,868,137Semiconductor device and method202010,861,751Method of semiconductor integrated circuit fabrication202010,784,106Selective film growth for bottom-up gap filling202010,741,674Selective silicon growth for gapfill improvement202010,727,064Post UV cure for gapfill improvement202010,685,867Method of semiconductor integrated circuit fabrication202010,535,751Selective silicon growth for gapfill improvement202010,535,557Interlayer dielectric film in semiconductor devices202010,510,865Cap layer and anneal for gapfill improvement201910,504,724Selective film growth for bottom-up gap filling201910,504,747Method of gap filling using conformal deposition-annealing-etching cycle for reducing seam void and bending201910,483,170Method of semiconductor integrated circuit fabrication201910,468,501Gap-filling germanium through selective bottom-up growth201910,347,741Gapfill improvement201910,332,746Post UV cure for gapfill improvement201910,249,530Interlayer dielectric film in semiconductor devices201910,170,305Selective film growth for bottom-up gap filling201910,115,624Method of semiconductor integrated circuit fabrication201810,008,418Method of semiconductor integrated circuit fabrication20189,634,141'Interlayer dielectric film in semiconductor devices'20179,482,518'Systems and methods for semiconductor device process determination using reflectivity measurement'20169,450,097'Methods for doping Fin field-effect transistors and Fin field-effect transistor'20169,324,865'Method of forming a semiconductor device'20169,209,280'Methods for doping fin field-effect transistors'20158,980,719'Methods for doping fin field-effect transistors'20158,883,522'System for semiconductor device characterization using reflectivity measurement'20148,877,599'Method of forming a semiconductor device'20148,753,904'Method and system for semiconductor device pattern loading effect characterization'20148,187,928'Methods of forming integrated circuits'2012Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2012–2016Patents assigned to TAIWAN SEMICONDUCTOR MFG (7)· patent assignee history
2012–2015Patents assigned to Yu de-wei (4)· patent assignee history
2012–2015Patents assigned to TSAI CHUN HSIUNG (3)· patent assignee history
2012–2015Patents assigned to HUANG YU-LIEN (2)· patent assignee history
2012–2020Based in Pingtung County, TW· patent location history
2016–2020Patents assigned to TAIWAN SEMICONDUCTOR MFG CO LTD (23)· patent assignee history
2018–2020Based in Taiwan, TW· patent location history
2019Based in Ping Tung, TW· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TAIWAN SEMICONDUCTOR MFG CO LTD | 23 | 2016–2020 |
| TAIWAN SEMICONDUCTOR MFG | 7 | 2012–2016 |
| Yu de-weiself | 4 | 2012–2015 |
| TSAI CHUN HSIUNG | 3 | 2012–2015 |
| HUANG YU-LIEN | 2 | 2012–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Pingtung County, TW | 27 | 2012–2020 |
| Taiwan, TW | 2 | 2018–2020 |
| Ping Tung, TW | 1 | 2019 |