Inventor
Isamu Karino
Inventor
Hyogo, JP
Overview
Patents· 7 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties25%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1021%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests17%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h108%
B05DProcesses for applying fluent materials to surfaces, in general4%
B82YSpecific uses or applications of nanostructures4%
C09DCoating compositions, e.g. paints, varnishes or lacquers4%
G01QScanning-probe techniques or apparatus4%
H01BCables4%
H04NPictorial communication, e.g. television4%
PatentTitleYear
6,355,495'Method and apparatus for analyzing minute foreign substance, and process for semiconductor elements or liquid crystal elements by use thereof'20026,255,127'Analyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the same'20016,124,142'Method for analyzing minute foreign substance elements'20005,877,035'Analyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the same'19995,795,919'Insulating paints'19985,715,052'Method of detecting the position and the content of fine foreign matter on substrates and analyzers used therefor'19985,517,027'Method for detecting and examining slightly irregular surface states, scanning probe microscope therefor, and method for fabricating a semiconductor device or a liquid crystal display device using these'1996Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1996–2002Patents assigned to MITSUBISHI ELECTRIC CORP (7)· patent assignee history
1996–1999Based in Amagasaki, JP· patent location history
1998Based in Tokyo, JP· patent location history
1999–2002Patents assigned to SEIKO INSTR INC (4)· patent assignee history
2000–2002Based in Hyogo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MITSUBISHI ELECTRIC CORP | 7 | 1996–2002 |
| SEIKO INSTR INC | 4 | 1999–2002 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hyogo, JP | 3 | 2000–2002 |
| Amagasaki, JP | 3 | 1996–1999 |
| Tokyo, JP | 1 | 1998 |