Inventor
Andrew J. Krivy
Inventor
Boise, ID, US
Overview
Patents· 14 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables67%
B24BMachines, devices, or processes for grinding or polishing19%
Y10TTechnical subjects covered by former us classification14%
PatentTitleYear
7,268,574'Systems and methods for sensing obstructions associated with electrical testing of microfeature workpieces'20077,250,780'Probe card for semiconductor wafers having mounting plate and socket'20076,798,224'Method for testing semiconductor wafers'20046,623,345'Wafer for cleaning semiconductor device probe'20036,419,844'Method for fabricating calibration target for calibrating semiconductor wafer test systems'20026,420,892'Calibration target for calibrating semiconductor wafer test systems'20026,359,456'Probe card and test system for semiconductor wafers'20026,275,052'Probe card and testing method for semiconductor wafers'20016,257,958'Method for cleaning semiconductor device probe'20016,254,469'Wafer for cleaning semiconductor device probe'20016,239,590'Calibration target for calibrating semiconductor wafer test systems'20016,060,891'Probe card for semiconductor wafers and method and system for testing wafers'20006,023,172'Light-based method and apparatus for maintaining probe cards'20006,019,663'System for cleaning semiconductor device probe'2000Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2000–2007Patents assigned to MICRON TECHNOLOGY INC (14)· patent assignee history
2000–2007Based in Boise, ID, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MICRON TECHNOLOGY INC | 14 | 2000–2007 |
Locations
| Location | Patents | Span |
|---|---|---|
| Boise, ID, US | 14 | 2000–2007 |