Inventor
MASUMI SHIRAI
Inventor
JP
Overview
Patents· 3 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps43%
G01BMeasuring length, thickness or similar linear dimensions14%
G01NInvestigating or analysing materials by determining their chemical or physical properties14%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices14%
G06TImage data processing or generation, in general14%
PatentTitleYear
12,505,976Charged particle beam apparatus and method for calculating roughness index202512,463,005Correction coefficient calculation device, correction coefficient calculation method, and correction coefficient calculation program202511,791,130Electron beam observation device, electron beam observation system, and image correcting method and method for calculating correction factor for image correction in electron beam observation device2023Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2023–2025Patents assigned to HITACHI HIGH TECH CORP (3)· patent assignee history
2023–2025Based in JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 3 | 2023–2025 |
Locations
| Location | Patents | Span |
|---|---|---|
| JP | 3 | 2023–2025 |