Inventor

Akihiko Yamano

Inventor
Sagamihara, JP

Overview

53→
Patents
1992–2011
Patent span
Physics
Primary field (CPC G)

Patents· 53 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

B82Yprimary
B82YSpecific uses or applications of nanostructures23%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests22%
G11BInformation storage based on relative movement between record carrier and transducer21%
G01QScanning-probe techniques or apparatus9%
H01JElectric discharge tubes or discharge lamps7%
G01BMeasuring length, thickness or similar linear dimensions5%
G09GArrangements or circuits for control of indicating devices using static means to present variable information5%
G01DMeasuring not specially adapted for a specific variable2%
H04NPictorial communication, e.g. television1%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein1%
PatentTitleYear
7,928,969'Image display apparatus'20117,791,264'Electron emission apparatus comprising electron-emitting devices, image-forming apparatus and voltage application apparatus for applying voltage between electrodes'20107,626,324'Image display apparatus'20097,492,087'Electron emission apparatus comprising electron-emitting devices, image forming apparatus and voltage application apparatus for applying voltage between electrodes'20097,388,561'Characteristics adjustment method of image forming apparatus, manufacturing method of image forming apparatus and characteristics adjustment apparatus of image forming apparatus'20087,304,640'Method of measuring luminance of image display apparatus, method of manufacturing the same, method and apparatus for adjusting characteristics of the same'20076,888,519'Characteristics adjustment method of image forming apparatus, manufacturing method of image forming apparatus and characteristics adjustment apparatus of image forming apparatus'20056,822,397'Method of manufacturing image forming apparatus'20046,760,001'Method of adjusting characteristics of electron source, method of manufacturing electron emission device'20046,677,706'Electron emission apparatus comprising electron-emitting devices, image-forming apparatus and voltage application apparatus for applying voltage between electrodes'20046,604,972'Image display apparatus manufacturing method'20036,580,407'Electron-beam generating device having plurality of cold cathode elements, method of driving said device and image forming apparatus applying same'20035,831,961'Information processing apparatus with probe undergoing circular motion'19985,812,516'Maintaining interatomic distance between an STM probe and a recording layer'19985,778,134'Apparatus for recording and reproducing image information in a recording medium wherein scanning probes are controlled based on editing information'19985,734,361'Electron-beam generating device having plurality of cold cathode elements, method of driving said device and image forming apparatus applying same'19985,721,721'Two scanning probes information recording/reproducing system with one probe to detect atomic reference location on a recording medium'19985,717,680'Information processing apparatus with mechanism for adjusting interval between substrate for supporting a plurality of probes and recording medium'19985,680,387'Detachable sealed container enclosing an information recording/reproducing probe and a recording medium'19975,581,537'Information record/reproducing apparatus and information recording medium'19965,535,018'Information processing apparatus'19965,526,334'Information processing apparatus with multiple probes and method therefor'19965,519,686'Encoder for controlling measurements in the range of a few angstroms'19965,517,482'Information recording/reproducing apparatus having fuzzy operating unit'19965,510,858'Television receiver having an STM memory'19965,502,710'Recording bit extraction by calculating curvature of pixels in scanning probe microscope'19965,488,602'Information record/reproducing apparatus and information recording medium'19965,485,451'Information processing apparatus'19965,471,458'Multi-probe information recording/reproducing apparatus including a probe displacement control circuit'19955,446,720'Information recording method and apparatus recording two or more changes in topographical and electrical states'19955,432,771'Information recording/reproducing apparatus for performing recording/reproduction of information by using probe'19955,432,346'Relative position change amount detecting apparatus having bi-directional probe with compensated movement'19955,418,771'Information processing apparatus provided with surface aligning mechanism between probe head substrate and recording medium substrate'19955,396,453'Recording/reproducing apparatus such as a memory apparatus'19955,394,388'Multiple microprobe arrays for recording and reproducing encoded information'19955,392,275'Information recording unit and method for information recording/reproduction'19955,371,728'Information recording/reproducing apparatus using probe'19945,371,727'Scanning tunnel microscopy information processing system with noise detection to correct the tracking mechanism'19945,349,735'Information detection apparatus and displacement information measurement apparatus'19945,329,122'Information processing apparatus and scanning tunnel microscope'19945,323,003'Scanning probe microscope and method of observing sample by using such a microscope'19945,304,924'Edge detector'19945,299,184'Information processing apparatus with held distance control on track edge detection'19945,289,455'Information recording and/or reproducing apparatus'19945,282,191'Information reproducing method and information reproducing apparatus which uses the method'19945,255,259'Method of access to recording medium, and apparatus and method for processing information'19935,251,200'Tracking method for memory apparatus'19935,202,879'Information recording medium, and information recording and/or reproducing method and apparatus'19935,199,021'Method of access to recording medium, and apparatus and method for processing information'19935,162,819'Information processing apparatus, information processing method, and recording medium employed therefor'19925,150,035'Encoder having atomic or molecular structure reference scale'19925,132,533'Method for forming probe and apparatus therefor'19925,130,554'Two-dimensional scanning device for detecting position between two relatively movable objects'1992

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1992–2011Patents assigned to CANON KK (53)· patent assignee history
1992–1998Based in Yokohama, JP· patent location history
1994–2011Based in Sagamihara, JP· patent location history
2004–2008Based in Kanagawa, JP· patent location history
2009–2011Patents assigned to TOSHIBA KK (2)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
CANON KK531992–2011
TOSHIBA KK22009–2011
Locations
LocationPatentsSpan
Sagamihara, JP271994–2011
Yokohama, JP211992–1998
Kanagawa, JP52004–2008