Inventor

Shigeyuki Hosoki

Inventor

Hachioji, JP

Overview

29→

Patents

1979–2005

Patent span

Physics

Primary field (CPC G)

Patents· 29 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

B82Yprimary

B82YSpecific uses or applications of nanostructures22%

G01QScanning-probe techniques or apparatus21%

Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests19%

H01JElectric discharge tubes or discharge lamps15%

G11BInformation storage based on relative movement between record carrier and transducer6%

G01RMeasuring electric variables4%

B82BNanostructures formed by manipulation of individual atoms, molecules, or limited collections of atoms or molecules as discrete units3%

G01NInvestigating or analysing materials by determining their chemical or physical properties3%

H02NElectric machines not otherwise provided for3%

B01JChemical or physical processes, e.g. catalysis or colloid chemistry1%

PatentTitleYear

6,875,984'Bio electron microscope and observation method of specimen'2005 5,767,516'Electron microscope and sample observing method using the same'1998 5,746,826'Method and apparatus for forming microstructure body'1998 5,698,798'Method and apparatus for dynamic observation of specimen'1997 5,689,494'Surface atom fabrication method and apparatus'1997 5,585,722'Apparatus for measuring physical properties of micro area'1996 5,572,122'Apparatus including a specimen tilt mechanism for measuring electromagnetic field distribution in the specimen using a focused electron beam'1996 5,436,448'Surface observing apparatus and method'1995 5,431,055'Surface measuring apparatus using a probe microscope'1995 5,416,331'Surface atom fabrication method and apparatus'1995 5,393,983'Magnetic electron lens and elctron microscope using the same'1995 5,256,876'Scanning tunnel microscope equipped with scanning electron microscope'1993 5,229,607'Combination apparatus having a scanning electron microscope therein'1993 5,222,396'Tunnelling acoustic microscope'1993 5,162,653'Scanning tunneling microscope and surface topographic observation method'1992 5,144,128'Surface microscope and surface microscopy'1992 5,140,272'Method of semiconductor surface measurment and an apparatus for realizing the same'1992 5,036,196'Surface microscope'1991 5,001,409'Surface metrological apparatus'1991 4,912,351'Piezoelectric motor'1990 4,883,959'Scanning surface microscope using a micro-balance device for holding a probe-tip'1989 4,841,191'Piezoelectric actuator control apparatus'1989 4,786,922'Electron beam recording and reproducing apparatus'1988 4,772,817'Cathode mounting a high-frequency piezoelectric chip'1988 4,772,821'Apparatus for introducing oxygen gas'1988 4,438,371'Source of charged particles beam'1984 4,379,250'Field emission cathode and method of fabricating the same'1983 4,193,013'Cathode for an electron source and a method of producing the same'1980 4,143,292'Field emission cathode of glassy carbon and method of preparation'1979

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1979–2005Patents assigned to HITACHI LTD (29)· patent assignee history

1979–2005Based in Hachioji, JP· patent location history

1988–1997Based in Hachiouji, JP· patent location history

1993Patents assigned to HITACHI CONSTRUCTION MACHINERY (1)· patent assignee history

1995–1998Based in Tokyo, JP· patent location history

2005Patents assigned to HITACHI HIGH TECH CORP (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
HITACHI LTD	29	1979–2005
HITACHI CONSTRUCTION MACHINERY	1	1993
HITACHI HIGH TECH CORP	1	2005

Locations

Location	Patents	Span
Hachioji, JP	24	1979–2005
Hachiouji, JP	3	1988–1997
Tokyo, JP	2	1995–1998