Inventor
Kazutaka Nimura
Inventor
Nagoya, JP
Overview
Patents· 7 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps58%
G01NInvestigating or analysing materials by determining their chemical or physical properties25%
F25BRefrigeration machines, plants or systems8%
G06TImage data processing or generation, in general8%
PatentTitleYear
10,269,533Anti-contamination trap, and vacuum application device201910,204,761Charged particle beam device, electron microscope and sample observation method20197,800,059'Method of forming a sample image and charged particle beam apparatus'20107,361,894'Method of forming a sample image and charged particle beam apparatus'20087,164,126'Method of forming a sample image and charged particle beam apparatus'20077,034,296'Method of forming a sample image and charged particle beam apparatus'20066,963,067'Scanning electron microscope and sample observing method using it'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005Patents assigned to HITACHI SCIENCE SYSTEMS INC (1)· patent assignee history
2005–2010Based in Nagoya, JP· patent location history
2006–2019Patents assigned to HITACHI HIGH TECH CORP (6)· patent assignee history
2019Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 6 | 2006–2019 |
| HITACHI SCIENCE SYSTEMS INC | 1 | 2005 |
Locations
| Location | Patents | Span |
|---|---|---|
| Nagoya, JP | 5 | 2005–2010 |
| Tokyo, JP | 2 | 2019 |