Inventor
Kang Ho Ahn
Inventor
Seoul, KR
Overview
Patents· 16 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties25%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1013%
B03CMagnetic or electrostatic separation of solid materials from solid materials or fluids9%
B05BSpraying apparatus9%
B01DSeparation6%
B01JChemical or physical processes, e.g. catalysis or colloid chemistry6%
B08BCleaning in general6%
G01RMeasuring electric variables6%
A61JContainers specially adapted for medical or pharmaceutical purposes3%
B32BLayered products, i.e. products built-up of strata of flat or non-flat, e.g. cellular or honeycomb, form3%
PatentTitleYear
10,845,347Particle sampling probe and fine dust measuring device using same202010,591,397Apparatus and system for classifying particles20208,072,598'Condensation particle counter'20117,972,567'Apparatus for manufacturing ultra-fine particles using corona discharge and method thereof'20117,724,368'Condensation particle counter'20107,719,683'Condensation particle counter'20107,605,910'Particle measuring system and method'20097,471,076'Apparatus for measuring numbers of particles and method thereof'20087,347,679'Apparatus for manufacturing ultra-fine particles using electrospray device and method thereof'20087,334,602'Apparatus for controlling flow rate of gases used in semiconductor device by differential pressure'20086,980,284'Condensation particle counter'20056,860,434'Apparatus for manufacturing ultra-fine particles using electrospray device and method thereof'20056,471,753'Device for collecting dust using highly charged hyperfine liquid droplets'20025,267,017'Method of particle analysis on a mirror wafer'19934,962,776'Process for surface and fluid cleaning'19904,817,652'System for surface and fluid cleaning'1989Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1989–1990Patents assigned to UNIV MINNESOTA (2)· patent assignee history
1989–1990Based in Minneapolis, MN, US· patent location history
1993–2020Based in Seoul, KR· patent location history
2002–2011Patents assigned to AHN KANG HO (6)· patent assignee history
2002Patents assigned to ACE LAB INC (1)· patent assignee history
2005–2008Patents assigned to HYUNDAI CALIBRATION & CERTIFIC (3)· patent assignee history
2008Based in Ichon-shi, KR· patent location history
2010Based in Daechi-dong, Gangnam-ku, Seoul 135-836, KR· patent location history
2020Patents assigned to IUCF HYU ERICA CAMPUS (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| AHN KANG HOself | 6 | 2002–2011 |
| HYUNDAI CALIBRATION & CERTIFIC | 3 | 2005–2008 |
| IUCF HYU ERICA CAMPUS | 2 | 2020 |
| UNIV MINNESOTA | 2 | 1989–1990 |
| ACE LAB INC | 1 | 2002 |
Locations
| Location | Patents | Span |
|---|---|---|
| Seoul, KR | 10 | 1993–2020 |
| Daechi-dong, Gangnam-ku, Seoul 135-836, KR | 2 | 2010 |
| Ichon-shi, KR | 2 | 2008 |
| Minneapolis, Minnesota, US | 2 | 1989–1990 |