Inventor
John H. Burdett, Jr.
Inventor
Charlton, NY, US
Overview
Patents· 19 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties36%
G21KHandling of particles or ionising radiation not otherwise provided for26%
H01JElectric discharge tubes or discharge lamps10%
H05GX-ray technique7%
G21FProtection against x-radiation, gamma radiation, corpuscular radiation or particle bombardment5%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests5%
A61NElectrotherapy2%
B01LChemical or physical laboratory apparatus for general use2%
B82YSpecific uses or applications of nanostructures2%
H03MCoding2%
PatentTitleYear
10,256,002Support structure and highly aligned monochromatic X-ray optics for X-ray analysis engines and analyzers20199,633,753'Mobile transport and shielding apparatus for removable x-ray analyzer'20179,360,440'Non-homogeneous sample handling apparatus and X-ray analyzer applications thereof'20169,343,193'XRF system having multiple excitation energy bands in highly aligned package'20169,335,280'Mobile transport and shielding apparatus for removable x-ray analyzer'20169,048,001'XRF system having multiple excitation energy bands in highly aligned package'20158,559,597'XRF system having multiple excitation energy bands in highly aligned package'2013D0628709'Sample cell for x-ray analyzer'20107,738,630'Highly aligned x-ray optic and source assembly for precision x-ray analysis applications'20107,729,471'Pre-filmed precision sample cell for x-ray analyzer'20107,519,159'Method and device for cooling and electrically insulating a high voltage, heat-generating component such as an x-ray tube for analyzing fluid streams'20097,515,684'Detection apparatus for x-ray analysis, including semiconductor detectors having uncooled active areas'20097,382,856'X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof'20087,209,545'X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof'20077,110,506'Method and device for cooling and electrically insulating a high-voltage, heat-generating component such as an x-ray tube for analyzing fluid streams'20067,092,843'Apparatus and method for suppressing insignificant variations in measured sample composition data, including data measured from dynamically changing samples using x-ray analysis techniques'20067,072,439'X-ray tube and method and apparatus for analyzing fluid streams using x-rays'20066,935,778'Methods and devices for aligning and determining the focusing characteristics of x-ray optics'20056,704,389'Support device for a polycapillary optic'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2019Patents assigned to X RAY OPTICAL SYS INC (18)· patent assignee history
2004Based in Porter Corners, NY, US· patent location history
2005–2019Based in Charlton, NY, US· patent location history
2010–2016Based in Scotia, NY, US· patent location history
2013Patents assigned to BAILEY ADAM (1)· patent assignee history
2013Patents assigned to BURDETT JOHN H (1)· patent assignee history
2013Patents assigned to CHEN ZEWU (1)· patent assignee history
2013Patents assigned to GIBSON DAVID M (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| X RAY OPTICAL SYS INC | 18 | 2004–2019 |
| BAILEY ADAM | 1 | 2013 |
| BURDETT JOHN Hself | 1 | 2013 |
| CHEN ZEWU | 1 | 2013 |
| GIBSON DAVID M | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Charlton, New York, US | 13 | 2005–2019 |
| Scotia, New York, US | 5 | 2010–2016 |
| Porter Corners, New York, US | 1 | 2004 |