Inventor

Harald Rose

Inventor
Darmstadt, DE

Overview

32→
Patents
1986–2013
Patent span
Electricity
Primary field (CPC H)

Patents· 32 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H01Jprimary
H01JElectric discharge tubes or discharge lamps89%
B82YSpecific uses or applications of nanostructures11%
PatentTitleYear
8,436,302'Phase-shifting element and particle beam device having a phase-shifting element'20138,173,963'Phase-shifting element and particle beam device having a phase-shifting element'20127,989,776'Corrective for eliminating the third-order aperture aberration and the first-order, first-degree axial, chromatic aberration'20117,973,289'Method for producing image contrast by phase shifting in electron optics'20117,902,506'Phase-shifting element and particle beam device having a phase-shifting element'20117,807,965'Corrector for axial and off-axial beam paths'20107,800,076'Electron-optical corrector for aplanatic imaging systems'20107,321,124'Corrector for correcting first-order chromatic aberrations of the first degree'20087,012,262'Corrector for correcting first-order chromatic aberrations of the first degree'20066,888,145'Optical particle corrector'20056,861,651'Electron-optical corrector for eliminating third-order aberations'20056,855,939'Particle beam system having a mirror corrector'20056,836,372'Electrostatic corrector'20046,797,962'Electrostatic corrector for eliminating the chromatic aberration of particle lenses'20046,784,437'Corrector for correcting first-order chromatic aberrations of the first degree'20046,774,372'Electron-optical lens arrangement with an axis that can be largely displaced'20046,559,445'Electron energy filter with magnetic deflecting regions'20035,449,914'Imaging electron energy filter'19955,448,063'Energy filter with correction of a second-order chromatic aberration'19955,336,885'Electron beam apparatus'19945,319,207'Imaging system for charged particles'19945,126,565'Energy filter for charged particle beam apparatus'19925,084,622'Correction system for a charged-particle beam apparatus'19924,980,558'Electron beam generator'19904,962,313'Wien-type imaging corrector for an electron microscope'19904,896,036'Detector objective for scanning microscopes'19904,853,545'Particle beam apparatus for low-error imaging of line-shaped subjects'19894,794,306'Flat picture-reproducing device'19884,760,261'Alpha-type electron energy filter'19884,740,704'Omega-type electron energy filter'19884,714,833'Arrangement for detecting secondary and/or backscatter electrons in an electron beam apparatus'19874,623,794'Particle beam blanking system'1986

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1986–2013Patents assigned to ROSE HARALD (4)· patent assignee history
1986–2013Based in Darmstadt, DE· patent location history
1987–1990Patents assigned to SIEMENS AG (4)· patent assignee history
1988–1995Patents assigned to ZEISS STIFTUNG (5)· patent assignee history
1992–1995Patents assigned to PHILIPS CORP (4)· patent assignee history
2004–2011Patents assigned to CEOS GMBH (7)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
CEOS GMBH72004–2011
ZEISS STIFTUNG51988–1995
PHILIPS CORP41992–1995
ROSE HARALDself41986–2013
SIEMENS AG41987–1990
Locations
LocationPatentsSpan
Darmstadt, DE321986–2013