Inventor
Kazunari Ishii
Inventor
Nirasaki, JP
Overview
Patents· 19 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables26%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1018%
G05BControl or regulating systems in general11%
A61BDiagnosis5%
B23QDetails, components, or accessories for machine tools, e.g. arrangements for copying or controlling5%
G03GElectrography5%
G06TImage data processing or generation, in general5%
B01DSeparation3%
B41JTypewriters3%
E04BGeneral building constructions3%
PatentTitleYear
10,705,483Particle collecting device and image forming apparatus202010,324,449Motor controlling method, control device and machine tool201910,261,495Controlling operation of a machining tool201910,168,666Image forming apparatus201910,126,732Device for controlling machine tool20189,891,274'Device test method'20189,647,340'Three-axis antenna'20179,030,218'Method for thermal stabilization of probe card and inspection apparatus'20158,866,503'Wafer chuck inclination correcting method and probe apparatus'20148,693,746'Technique for detecting neurodegenerative disorders'20148,395,401'Method for setting contact parameter and recording medium having program for setting contact parameter recorded thereon'20138,165,362'Neurodegenerative disease detection method, detecting program, and detector'20128,027,528'Method for calculating height of chuck top and program storage medium for storing same method'20117,710,135'Method for registering probe card and a storage medium storing program thereof'20107,626,406'Probing method, probe apparatus and storage medium'20097,009,415'Probing method and probing apparatus'20066,777,968'Probing method and probing apparatus in which steady load is applied to main chuck'20046,297,656'Probe-test method and prober'20015,440,844'Connectors for building unit'1995Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2001–2018Patents assigned to TOKYO ELECTRON LTD (9)· patent assignee history
2004–2014Based in Nirasaki, JP· patent location history
2012–2015Patents assigned to ISHII KAZUNARI (5)· patent assignee history
2012–2014Patents assigned to NIHON MEDIPHYSICS CO LTD (2)· patent assignee history
2015–2018Based in Yamanashi, JP· patent location history
2017Based in Tsurugashima, JP· patent location history
2018–2019Patents assigned to MAKINO MILLING MACHINE (3)· patent assignee history
2018–2019Based in Aiko-gun, JP· patent location history
2019–2020Patents assigned to FUJI XEROX CO LTD (2)· patent assignee history
2019–2020Based in Kanagawa, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TOKYO ELECTRON LTD | 9 | 2001–2018 |
| ISHII KAZUNARIself | 5 | 2012–2015 |
| MAKINO MILLING MACHINE | 3 | 2018–2019 |
| FUJI XEROX CO LTD | 2 | 2019–2020 |
| NIHON MEDIPHYSICS CO LTD | 2 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Nirasaki, JP | 7 | 2004–2014 |
| Kanagawa, JP | 3 | 2019–2020 |
| Aiko-gun, JP | 2 | 2018–2019 |
| Yamanashi, JP | 2 | 2015–2018 |
| Tsurugashima, JP | 1 | 2017 |