Inventor
Marc A. Taubenblatt
Inventor
Pleasantville, NY, US
Overview
Patents· 19 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties27%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1016%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light14%
G02BOptical elements, systems or apparatus14%
G05BControl or regulating systems in general8%
B08BCleaning in general5%
H04BTransmission5%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein3%
H03CModulation3%
H04LTransmission of digital information, e.g. telegraphic communication3%
PatentTitleYear
10,613,279Photonic waveguide coupling using offset light source202010,488,605Photonic waveguide coupling using offset light source20199,912,413'Electro-optic phase modulator with no residual amplitude modulation'20189,735,879'Near-threshold optical transmitter pre-distortion'20178,901,576'Silicon photonics wafer using standard silicon-on-insulator processes through substrate removal or transfer'20148,125,984'Method, system, and computer program product for implementing stream processing using a reconfigurable optical switch'20126,678,569'User configurable multivariate time series reduction tool control method'20046,584,368'User configurable multivariate time series reduction tool control method'20036,442,445'User configurable multivariate time series reduction tool control method'20025,974,868'Downstream monitor for CMP brush cleaners'19995,834,642'Downstream monitor for CMP brush cleaners'19985,432,607'Method and apparatus for inspecting patterned thin films using diffracted beam ellipsometry'19955,343,290'Surface particle detection using heterodyne interferometer'19945,220,403'Apparatus and a method for high numerical aperture microscopic examination of materials'19935,208,648'Apparatus and a method for high numerical aperture microscopic examination of materials'19935,177,559'Dark field imaging defect inspection system for repetitive pattern integrated circuits'19935,133,602'Particle path determination system'19925,061,070'Particulate inspection of fluids using interferometric light measurements'19915,037,202'Measurement of size and refractive index of particles using the complex forward-scattered electromagnetic field'1991Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1991–2020Patents assigned to IBM (19)· patent assignee history
1991–2020Based in Pleasantville, NY, US· patent location history
1991Based in Tarrytown, NY, US· patent location history
1998Based in Pleasentville, NY, US· patent location history
2012Patents assigned to GILES JAMES R (1)· patent assignee history
2012Patents assigned to HALIM NAGUI (1)· patent assignee history
2012Patents assigned to HILDRUM KIRSTEN W (1)· patent assignee history
2014Patents assigned to DOANY FUAD E (1)· patent assignee history
2018Based in Yorktown Heights, NY, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 19 | 1991–2020 |
| DOANY FUAD E | 1 | 2014 |
| GILES JAMES R | 1 | 2012 |
| HALIM NAGUI | 1 | 2012 |
| HILDRUM KIRSTEN W | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Pleasantville, New York, US | 16 | 1991–2020 |
| Yorktown Heights, New York, US | 1 | 2018 |
| Pleasentville, New York, US | 1 | 1998 |
| Tarrytown, New York, US | 1 | 1991 |