Inventor
Chu Fu Chen
Inventor
Zhubei City, TW
Overview
Patents· 17 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Lprimary
H01LSemiconductor devices22%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1016%
H10DInorganic electric semiconductor devices12%
H02MApparatus for conversion between ac and ac, between ac and dc, or between dc and dc, and for use with mains or similar power supply systems10%
G01RMeasuring electric variables8%
H03KPulse technique8%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h108%
G06FElectric digital data processing4%
F16FSprings2%
F24FAir-conditioning2%
PatentTitleYear
11,073,189Pre-compression type emergency air spring assembly202110,804,895Low static current semiconductor device202010,784,781Transistor having asymmetric threshold voltage, buck converter and method of forming semiconductor device202010,678,968Method of verifying and analyzing energy efficiency ratio EER of a heating ventilation and air conditioning HVAC chiller unit202010,644,601Dead-time conduction loss reduction for buck power converters202010,535,572Device arrangement structure assembly and test method202010,284,195Low static current semiconductor device201910,276,457Method for measuring charge accumulation in fabrication process of semiconductor device and method for fabricating semiconductor device201910,134,868MOS devices with mask layers and methods for forming the same201810,050,621Low static current semiconductor device20189,947,762MOS devices with mask layers and methods for forming the same20189,658,278'Method and apparatus for high voltage device crystal defect detection'20179,236,273'UV protection for lightly doped regions'20169,159,802'MOS devices with mask layers and methods for forming the same'20159,086,450'Method for measuring capacitances of capacitors'20158,779,796'Method and apparatus for device parameter measurement'20148,418,098'Advisory system for verifying sensitive circuits in chip-design'2013Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2013–2015Patents assigned to TAIWAN SEMICONDUCTOR MFG (4)· patent assignee history
2013–2015Patents assigned to CHEN CHU-FU (3)· patent assignee history
2013–2020Based in Zhubei City, TW· patent location history
2014–2020Patents assigned to CHEN CHU FU (2)· patent assignee history
2014–2015Patents assigned to LIU MIN-TAR (2)· patent assignee history
2016–2020Patents assigned to TAIWAN SEMICONDUCTOR MFG CO LTD (11)· patent assignee history
2016–2020Based in Hsinchu County, TW· patent location history
2020Based in Taipei, TW· patent location history
2021Based in Hunan, CN· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TAIWAN SEMICONDUCTOR MFG CO LTD | 11 | 2016–2020 |
| TAIWAN SEMICONDUCTOR MFG | 4 | 2013–2015 |
| CHEN CHU-FUself | 3 | 2013–2015 |
| CHEN CHU FUself | 2 | 2014–2020 |
| LIU MIN-TAR | 2 | 2014–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Zhubei City, TW | 10 | 2013–2020 |
| Hsinchu County, TW | 5 | 2016–2020 |
| Hunan, CN | 1 | 2021 |
| Taipei, TW | 1 | 2020 |