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Inventor

Wei-Fan Chen

Inventor
Taichung, TW

Overview

48→
Patents
2000–2021
Patent span
Electricity
Primary field (CPC H)

Patents· 48 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H10Dprimary
H10DInorganic electric semiconductor devices59%
H02MApparatus for conversion between ac and ac, between ac and dc, or between dc and dc, and for use with mains or similar power supply systems10%
G11CStatic stores5%
H01LSemiconductor devices3%
H02HEmergency protective circuit arrangements3%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h103%
Y02BClimate change mitigation technologies related to buildings, e.g. housing, house appliances or related end-user applications3%
A61BDiagnosis2%
G01BMeasuring length, thickness or similar linear dimensions2%
G01CMeasuring distances, levels or bearings2%
PatentTitleYear
10,921,168Integrated measuring system and method202110,908,408Pixel structure, method for manufacturing pixel structure array substrate, and display device202110,495,459Apparatus for producing 3D point-cloud model of physical object and producing method thereof20199,438,034'Transient voltage suppressor'20169,123,557'Fast recovery rectifier'20158,981,426'Electrostatic discharge protection device'20158,749,213'Mixed mode control for switching regulator with fast transient responses'20148,610,169'Electrostatic discharge protection circuit'20138,416,587'Synchronous rectifier control circuits and methods of controlling synchronous rectifiers'20138,405,370'Power regulation for large transient loads'20138,390,070'Electrostatic discharge protection device and electrostatic discharge protection circuit thereof'20138,314,598'Control for regulator fast transient response and low EMI noise'20128,169,205'Control for regulator fast transient response and low EMI noise'20128,138,731'Power regulation for large transient loads'20127,291,887'Protection circuit for electrostatic discharge'20077,256,461'Electrostatic discharge (ESD) protection device'20077,075,154'Electrostatic discharge protection device'20067,072,161'High ESD stress sustaining ESD protection circuit'20067,034,363'Bi-directional EOS/ESD protection device'20067,012,307'Output buffer with good ESD protection'20067,009,252'ESD protection devices and methods for reducing trigger voltage'20066,958,896'Early triggered ESD MOSFET protection circuit and method thereof'20056,919,602'Gate-coupled MOSFET ESD protection circuit'20056,864,536'Electrostatic discharge protection circuit'20056,858,900'ESD protection devices and methods to reduce trigger voltage'20056,850,440'Method for improved programming efficiency in flash memory cells'20056,844,595'Electrostatic discharge protection circuit with high triggering voltage'20056,838,708'I/O cell and ESD protection circuit'20056,759,691'ESD protection circuit having a high triggering threshold'20046,740,570'Method for forming a self-aligned silicide of a metal oxide semiconductor'20046,720,623'ESD protection device coupled between two high power lines'20046,696,708'Electrostatic discharge protection apparatus'20046,664,599'ESD protection device'20036,573,568'ESD protection devices and methods for reducing trigger voltage'20036,560,080'Low-voltage triggered ESD protection circuit'20036,556,398'Voltage tolerance ESD protection circuit'20036,542,346'High-voltage tolerance input buffer and ESD protection circuit'20036,510,088'Semiconductor device having reduced leakage and method of operating the same'20036,493,199'Vertical zener-triggered SCR structure for ESD protection in integrated circuits'20026,486,692'Method of positive mobile iron contamination (PMIC) detection and apparatus of performing the same'20026,441,439'Low-voltage triggering pseudo bipolar ESD protection device for positive/negative signal input pads'20026,344,995'Circuit for controlling the potential difference between the substrate and the control gate on non-volatile memory and its control method'20026,287,931'Method of fabricating on-chip inductor'20016,281,527'Electrostatic discharge protection circuit with high trigger current'20016,246,079'SCR circuit with a high trigger current'20016,229,185'CMOS integrated circuit for lessening latch-up susceptibility'20016,172,403'Electrostatic discharge protection circuit triggered by floating-base transistor'20016,147,369'SCR and current divider structure of electrostatic discharge protective circuit'2000

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2000–2007Patents assigned to WINBOND ELECTRONICS CORP (32)· patent assignee history
2000–2007Based in Taichung, TW· patent location history
2002–2007Based in Hsinchu, TW· patent location history
2012–2014Patents assigned to CHEN WEI (6)· patent assignee history
2012–2014Patents assigned to SILERGY TECHNOLOGY (6)· patent assignee history
2012–2014Based in Saratoga, CA, US· patent location history
2013–2016Patents assigned to NANYA TECHNOLOGY CORP (4)· patent assignee history
2013Patents assigned to CHEN WEI-FAN (2)· patent assignee history
2013–2016Based in Taoyuan County, TW· patent location history
2021Based in Beijing, CN· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
WINBOND ELECTRONICS CORP322000–2007
CHEN WEIself62012–2014
SILERGY TECHNOLOGY62012–2014
NANYA TECHNOLOGY CORP42013–2016
CHEN WEI-FANself22013
Locations
LocationPatentsSpan
Taichung, TW292000–2007
Saratoga, California, US62012–2014
Hsinchu, TW42002–2007
Taoyuan County, TW32013–2016
Beijing, CN22021