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Inventor

Justin LACH

Inventor
US

Overview

2→
Patents
2025
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties25%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices25%
G01BMeasuring length, thickness or similar linear dimensions13%
G06NComputing arrangements based on specific computational models13%
H01LSemiconductor devices13%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1013%
PatentTitleYear
12,422,376Imaging reflectometry for inline screening202512,332,182System for automatic diagnostics and monitoring of semiconductor defect die screening performance through overlay of defect and electrical test data2025

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2025Patents assigned to KLA CORP (2)· patent assignee history
2025Based in US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
KLA CORP22025
Locations
LocationPatentsSpan
US22025