Inventor
Charles E. Hunt
Inventor
Davis, CA, US
Overview
Patents· 22 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps20%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1020%
B81CProcesses or apparatus specially adapted for the manufacture or treatment of microstructural devices or systems9%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests9%
C09KMaterials for miscellaneous applications, not provided for elsewhere7%
H10DInorganic electric semiconductor devices7%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h107%
B24BMachines, devices, or processes for grinding or polishing4%
G02BOptical elements, systems or apparatus4%
H05BElectric heating4%
PatentTitleYear
10,520,383Temperature-compensating absolute pressure sensor20198,853,944'System and apparatus for cathodoluminescent lighting'20148,749,127'System and manufacturing a cathodoluminescent lighting device'20148,662,522'Tow bar assembly'20148,330,376'System and apparatus for cathodoluminescent lighting'20128,308,520'Cathodoluminescent phosphor lamp having extraction and diffusing grids and base for attachment to standard lighting fixtures'20128,294,367'System and apparatus for cathodoluminescent lighting'20128,102,122'System and apparatus for cathodoluminescent lighting'20128,058,789'Cathodoluminescent phosphor lamp having extraction and diffusing grids and base for attachment to standard lighting fixtures'20117,834,553'System and apparatus for cathodoluminescent lighting'20106,972,245'Method for co-fabricating strained and relaxed crystalline and poly-crystalline structures'20056,884,640'Method and apparatus for determining layer thickness and composition using ellipsometric evaluation'20056,818,137'Fabrication of electronic magnetic, optical, chemical, and mechanical systems using chemical endpoint detection'20046,800,212'Fabrication of optical components using Si, SiGe, SiGeC, and chemical endpoint detection'20046,642,154'Method and apparatus for fabricating structures using chemically selective endpoint detection'20036,559,058'Method of fabricating three-dimensional components using endpoint detection'20036,545,299'Structures using chemo-mechanical polishing and chemically-selective endpoint detection'20036,465,357'Fabricating structures using chemo-mechanical polishing and chemically-selective endpoint detection'20026,064,081'Silicon-germanium-carbon compositions and processes thereof'20006,054,801'Field emission cathode fabricated from porous carbon foam material'20005,961,877'Wet chemical etchants'19995,906,708'Silicon-germanium-carbon compositions in selective etch processes'1999Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1999–2014Based in Davis, CA, US· patent location history
2000–2005Patents assigned to UNIV CALIFORNIA (10)· patent assignee history
2010–2014Patents assigned to VU1 CORP (8)· patent assignee history
2011–2014Patents assigned to HUNT CHARLES E (6)· patent assignee history
2011–2012Patents assigned to HERRING RICHARD N (5)· patent assignee history
2011–2014Patents assigned to VANCIL BERNARD K (3)· patent assignee history
2014Based in South Haven, MN, US· patent location history
2019Based in Big Lake, MN, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| UNIV CALIFORNIA | 10 | 2000–2005 |
| VU1 CORP | 8 | 2010–2014 |
| HUNT CHARLES Eself | 6 | 2011–2014 |
| HERRING RICHARD N | 5 | 2011–2012 |
| VANCIL BERNARD K | 3 | 2011–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Davis, California, US | 20 | 1999–2014 |
| Big Lake, Minnesota, US | 1 | 2019 |
| South Haven, Minnesota, US | 1 | 2014 |