Inventor
Fumiya Yagi
Inventor
Toyonaka, JP
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions21%
G06TImage data processing or generation, in general11%
G01CMeasuring distances, levels or bearings8%
G01SRadio direction-finding8%
G02BOptical elements, systems or apparatus8%
B29CShaping or joining of plastics5%
H04NPictorial communication, e.g. television5%
A61BDiagnosis3%
B29KIndexing scheme associated with subclasses b29b, b29c or b29d, relating to moulding materials or to materials for moulds, reinforcements, fillers or preformed parts, e.g. inserts3%
B32BLayered products, i.e. products built-up of strata of flat or non-flat, e.g. cellular or honeycomb, form3%
PatentTitleYear
8,379,332'Screw component and image capturing device'20137,760,443'Zoom lens device'20107,027,641'Three-dimensional shape measuring system'20066,975,361'Imaging system, two-dimensional photographing device and three-dimensional measuring device'20056,882,435'Three-dimensional data input apparatus'20056,853,458'Three-dimensional measuring method and device, and computer program'20056,788,807'Three dimensional information measurement method and apparatus'20046,612,824'Three-dimensional object molding apparatus'20036,587,185'Distance measuring apparatus'20036,529,280'Three-dimensional measuring device and three-dimensional measuring method'20036,522,412'Measuring system with improved method of reading image data of an object'20036,506,477'Apparatus and method for forming three-dimensional object'20036,507,406'Three-dimensional data input apparatus'20036,407,817'Measuring system with improved method of reading image data of an object'20026,243,165'Measuring system with improved method of reading image data of an object'20016,204,916'Three dimensional information measurement method and apparatus'20016,141,105'Three-dimensional measuring device and three-dimensional measuring method'20005,668,631'Measuring system with improved method of reading image data of an object'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1997–2006Patents assigned to MINOLTA CO LTD (16)· patent assignee history
1997–2003Based in Ibaraki, JP· patent location history
2000–2006Based in Toyonaka, JP· patent location history
2010–2013Patents assigned to PANASONIC CORP (2)· patent assignee history
2010–2013Based in Osaka, JP· patent location history
2013Patents assigned to YAGI FUMIYA (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MINOLTA CO LTD | 16 | 1997–2006 |
| PANASONIC CORP | 2 | 2010–2013 |
| YAGI FUMIYAself | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Toyonaka, JP | 12 | 2000–2006 |
| Ibaraki, JP | 4 | 1997–2003 |
| Osaka, JP | 2 | 2010–2013 |