Inventor
Phat C. Truong
Inventor
Houston, TX, US
Overview
Patents· 33 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Cprimary
G11CStatic stores60%
H03KPulse technique16%
G01RMeasuring electric variables7%
G05FSystems for regulating electric or magnetic variables5%
G06FElectric digital data processing5%
H03HImpedance networks, e.g. resonant circuits2%
H03LAutomatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses2%
H10DInorganic electric semiconductor devices2%
PatentTitleYear
8,988,967'Method of increasing a timing margin for relaying data to a memory array'20158,861,291'Memory apparatus and signal delay circuit for generating delayed column select signal'20148,369,165'Synchronous signal generating circuit'20138,264,907'Method of increasing a timing margin for writing data to a memory array'20128,098,083'Apparatus and method for controlling delay stage of off-chip driver'20127,940,543'Low power synchronous memory command address scheme'20117,911,262'External compensation for input current source'20117,834,683'Method to reduce variation in CMOS delay'20107,737,728'OCD driver slew rate control'20105,694,073'Temperature and supply-voltage sensing circuit'19975,668,769'Memory device performance by delayed power-down'19975,657,268'Array-source line, bitline and wordline sequence in flash operations'19975,646,887'Sense amplifier with pre-charge circuit and low-voltage operation mode'19975,636,226'Fault sensing circuit and method'19975,636,162'Erase procedure'19975,491,658'Column decoder for virtual ground memory array'19965,450,417'Circuit for testing power-on-reset circuitry'19955,424,992'Method and device for detecting and controlling an array source signal discharge for a memory erase operation'19955,397,946'High-voltage sensor for integrated circuits'19955,396,115'Current-sensing power-on reset circuit for integrated circuits'19955,392,248'Circuit and method for detecting column-line shorts in integrated-circuit memories'19955,313,432'Segmented, multiple-decoder memory array and method for programming a memory array'19945,287,536'Nonvolatile memory array wordline driver circuit with voltage translator circuit'19945,255,271'Integrated circuit internal test mode indicator circuit'19935,197,029'Common-line connection for integrated memory array'19935,182,726'Circuit and method for discharging a memory array'19935,157,280'Switch for selectively coupling a power supply to a power bus'19925,151,880'Method and apparatus for determining the field position of an integrated circuit within a reticle area'19925,140,554'Integrated circuit fuse-link tester and test method'19925,132,933'Bias circuitry for nonvolatile memory array'19925,022,008'PROM speed measuring method'19915,020,026'Method and apparatus for reading and programming electrically programmable memory cells'19914,820,941'Decoder driver circuit for programming high-capacitance lines'1989Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1989–1997Patents assigned to TEXAS INSTRUMENTS INC (22)· patent assignee history
1989–2015Based in Houston, TX, US· patent location history
2010–2015Patents assigned to NANYA TECHNOLOGY CORP (9)· patent assignee history
2012–2015Patents assigned to TRUONG PHAT (5)· patent assignee history
2012–2015Patents assigned to LE TIEN DINH (2)· patent assignee history
2012Patents assigned to CHANG CHIA-JEN (1)· patent assignee history
2013Based in Taoyuan County, TW· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TEXAS INSTRUMENTS INC | 22 | 1989–1997 |
| NANYA TECHNOLOGY CORP | 9 | 2010–2015 |
| TRUONG PHATself | 5 | 2012–2015 |
| LE TIEN DINH | 2 | 2012–2015 |
| CHANG CHIA-JEN | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Houston, Texas, US | 32 | 1989–2015 |
| Taoyuan County, TW | 1 | 2013 |