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Inventor

Jin-Liang Chen

Inventor
Hsinchu, TW

Overview

16→
Patents
1993–2021
Patent span
Physics
Primary field (CPC G)

Patents· 16 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions43%
G01HMeasurement of mechanical vibrations or ultrasonic, sonic or infrasonic waves10%
H01JElectric discharge tubes or discharge lamps10%
H03LAutomatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses10%
A63BApparatus for physical training, gymnastics, swimming, climbing, or fencing5%
G01MTesting static or dynamic balance of machines or structures5%
G02BOptical elements, systems or apparatus5%
H03KPulse technique5%
H04NPictorial communication, e.g. television5%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests5%
PatentTitleYear
10,985,767Phase-locked loop circuitry having low variation transconductance design202110,972,111Phase-locked loop circuit2021RE043925'Three dimensional profile inspecting apparatus'20138,237,933'Method for image calibration and apparatus for image acquiring'20128,035,820'Method and apparatus for resonant frequency identification through out-of-plane displacement detection'20118,018,601'Method for determining vibration displacement and vibrating frequency and apparatus using the same'20118,005,290'Method for image calibration and apparatus for image acquiring'20117,986,402'Three dimensional profile inspecting apparatus'20117,965,394'Method and apparatus for identifying dynamic characteristics of a vibratory object'20117,929,044'Autofocus searching method'20117,782,466'Method and apparatus for resonant frequency identification through out-of-plane displacement detection'20107,619,190'Tilting adjustable surface profilometer'20097,536,265'Signal analysis method for vibratory interferometry'20096,489,622'Apparatus for decelerating ion beams with minimal energy contamination'20026,313,428'Apparatus and method for reducing space charge of ion beams and wafer charging'20015,232,421'Stepper'1993

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1993–2013Patents assigned to CHEN JIN LIANG (2)· patent assignee history
2001–2002Patents assigned to ADVANCED ION BEAM TECHNOLOGY I (2)· patent assignee history
2001–2002Based in Cupertino, CA, US· patent location history
2009–2013Patents assigned to IND TECH RES INST (10)· patent assignee history
2009–2011Patents assigned to UNIV NAT TAIPEI TECHNOLOGY (4)· patent assignee history
2009–2012Based in Hsinchu, TW· patent location history
2011–2013Based in Chu-Dong Township, TW· patent location history
2011Based in Hualien County, TW· patent location history
2021Patents assigned to AMS AG (2)· patent assignee history
2021Based in Premstaetten, AT· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
IND TECH RES INST102009–2013
UNIV NAT TAIPEI TECHNOLOGY42009–2011
ADVANCED ION BEAM TECHNOLOGY I22001–2002
AMS AG22021
CHEN JIN LIANGself21993–2013
Locations
LocationPatentsSpan
Hsinchu, TW82009–2012
Premstaetten, AT22021
Chu-Dong Township, TW22011–2013
Cupertino, California, US22001–2002
Hualien County, TW12011