Inventor
Kouichi Uesaka
Inventor
Yokohama, JP
Overview
Patents· 22 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables31%
G06KGraphical data reading24%
H01QAntennas, i.e. radio aerials14%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein7%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h107%
H01BCables3%
H01PWaveguides3%
H02JElectric power networks3%
H05KPrinted circuits3%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h103%
PatentTitleYear
8,111,163'Methods for manufacturing and application of RFID built-in cable, and dedicated RFID reading systems'20128,035,522'RFID tag'20117,595,650'Magnetic field probe apparatus and a method for measuring magnetic field'20097,439,933'Signal processing circuit, and non-contact IC card and tag with the use thereof'20087,355,270'Semiconductor chip with coil antenna and communication system'20087,334,736'Antenna-coil design apparatus and design method'20087,315,173'Method of measuring electric field distribution and electric field distribution measuring instrument'20087,132,997'Narrow-directivity electromagnetic-field antenna probe, and electromagnetic-field measurement apparatus, electric-current distribution search-for apparatus or electrical-wiring diagnosis apparatus using this antenna probe'20066,875,920'Semiconductor device and design support method of electronic device using the same'20056,856,709'Optical modulation device'20056,833,714'Inquiry method of the source which generates electromagnetic wave'20046,781,741'Mach-Zehnder optical modulator'20046,697,744'Inquiry method of the source which generates electromagnetic wave'20046,643,594'Electromagnetic wave source probing device and probing method with the probing device'20036,625,554'Method and apparatus for determining a magnetic field'20036,617,860'Apparatus and method for detecting electromagnetic wave source, and method for analyzing the same'20036,608,550'Reader and/or writer apparatus, power feeding system, and communication system'20036,470,282'Electromagnetic wave source probing device and probing method with the probing device'20026,411,104'Apparatus and method for detecting electromagnetic wave source, and method for analyzing the same'20026,194,993'Reader and/or writer apparatus, power feeding system, and communication system'20016,176,433'Reader/writer having coil arrangements to restrain electromagnetic field intensity at a distance'20016,164,532'Power transmission system, power transmission/communication system and reader and/or writer'2000Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2000–2012Patents assigned to HITACHI LTD (21)· patent assignee history
2000–2012Based in Yokohama, JP· patent location history
2001–2003Patents assigned to KOKUSAI ELECTRIC CO LTD (2)· patent assignee history
2002–2006Based in Kawasaki, JP· patent location history
2005Patents assigned to OPNEXT JAPAN INC (1)· patent assignee history
2012Patents assigned to ARAKI KENJI (1)· patent assignee history
2012Patents assigned to OTA CHIKARA (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI LTD | 21 | 2000–2012 |
| KOKUSAI ELECTRIC CO LTD | 2 | 2001–2003 |
| ARAKI KENJI | 1 | 2012 |
| OPNEXT JAPAN INC | 1 | 2005 |
| OTA CHIKARA | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Yokohama, JP | 11 | 2000–2012 |
| Kawasaki, JP | 11 | 2002–2006 |