Inventor
Ricardo Pureza Coimbra
Inventor
Campinas, BR
Overview
Patents· 21 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G05Fprimary
G05FSystems for regulating electric or magnetic variables24%
G01KMeasuring temperature16%
H03KPulse technique16%
H03FAmplifiers13%
G01RMeasuring electric variables11%
H02MApparatus for conversion between ac and ac, between ac and dc, or between dc and dc, and for use with mains or similar power supply systems5%
H03LAutomatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses5%
G06FElectric digital data processing3%
G11CStatic stores3%
H03BGeneration of oscillations, directly or by frequency-changing, by circuits employing active elements which operate in a non-switching manner3%
PatentTitleYear
11,125,629Temperature detection circuitry202111,128,306Clock generation202111,106,231Capless voltage regulator with adaptative compensation202111,043,893Bias regulation system202110,819,279Low power crystal oscillator202010,712,210Self-referenced, high-accuracy temperature sensors202010,658,927Back-biasing regulation system and method for integrated circuits202010,429,879Bandgap reference voltage circuitry201910,394,264Back bias regulator circuit and method therefor201910,205,423Rail-to-rail source follower201910,156,861Low-dropout regulator with pole-zero tracking frequency compensation20189,785,177'Symmetrical positive and negative reference voltage generation'20179,641,129'Low power circuit for amplifying a voltage without using resistors'20179,467,107'Rail-to-rail follower circuits'20169,356,590'Production test trimming acceleration'20169,310,261'Production-test die temperature measurement method and apparatus'20169,194,890'Metal-oxide-semiconductor (MOS) voltage divider with dynamic impedance control'20159,074,943'Production-test die temperature measurement'20158,890,612'Dynamically biased output structure'20148,432,214'Programmable temperature sensing circuit for an integrated circuit'20138,378,735'Die temperature sensor circuit'2013Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2013–2017Patents assigned to FREESCALE SEMICONDUCTOR INC (9)· patent assignee history
2013Patents assigned to COIMBRA RICARDO P (1)· patent assignee history
2013Patents assigned to COIMBRA RICARDO PUREZA (1)· patent assignee history
2013–2021Based in Campinas, BR· patent location history
2017–2021Patents assigned to NXP USA INC (13)· patent assignee history
2017–2018Patents assigned to NXP BV (2)· patent assignee history
2020Based in Sao Paulo, BR· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NXP USA INC | 13 | 2017–2021 |
| FREESCALE SEMICONDUCTOR INC | 9 | 2013–2017 |
| NXP BV | 2 | 2017–2018 |
| COIMBRA RICARDO Pself | 1 | 2013 |
| COIMBRA RICARDO PUREZAself | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Campinas, BR | 20 | 2013–2021 |
| Sao Paulo, BR | 1 | 2020 |