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Inventor

An-Ru Cheng

Inventor
Hsinchu, TW

Overview

5→
Patents
2004–2008
Patent span
Physics
Primary field (CPC G)

Patents· 5 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables60%
H10BElectronic memory devices40%
PatentTitleYear
7,464,357'Integrated circuit capable of locating failure process layers'20087,089,137'Universal test platform and test method for latch-up'20067,036,099'Integrated circuit capable of locating failure process layers'20066,806,142'Method for coding semiconductor permanent store ROM'20046,756,275'Method for minimizing product turn-around time for making semiconductor permanent store ROM cell'2004

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2004–2008Patents assigned to FARADAY TECH CORP (5)· patent assignee history
2004–2008Based in Hsinchu, TW· patent location history
2004Based in Valencia, CA, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
FARADAY TECH CORP52004–2008
Locations
LocationPatentsSpan
Hsinchu, TW42004–2008
Valencia, California, US12004