Inventor
HUI-JUNG TSAI
Inventor
TW
Overview
Patents· 48 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Lprimary
H01LSemiconductor devices31%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1029%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1026%
H10DInorganic electric semiconductor devices6%
G01NInvestigating or analysing materials by determining their chemical or physical properties2%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices2%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light2%
H10HInorganic light-emitting semiconductor devices having potential barriers2%
G01RMeasuring electric variables1%
PatentTitleYear
12,469,757Package structure including a die having a taper-shaped die connector202512,469,718Dense redistribution layers in semiconductor packages and methods of forming the same202512,431,400Packages with enlarged through-vias in encapsulant202512,381,176Semiconductor structure having a conductive feature comprising an adhesion layer and a metal region over and contacting the adhesion layer202512,374,627Method of fabricating semiconductor structure202512,362,309Package structure202512,315,819Method of forming RDLs and structure formed thereof202512,302,677Semiconductor device and method202512,176,321Semiconductor packages and method of forming the same202412,164,232Method for removing resistor layer, and method of manufacturing semiconductor202412,165,985Semiconductor device and method202412,148,732Package structure and method of fabrcating the same202412,132,023Integrated circuit, package structure, and manufacturing method of package structure202412,080,609Method of detecting photoresist scum, method of forming semiconductor package and photoresist scum detection apparatus202412,062,603Semiconductor device having via sidewall adhesion with encapsulant202412,040,283Method of fabricating semiconductor structure202412,021,026Package structure and method of fabricating the same202412,020,983Processes for reducing leakage and improving adhesion202411,996,381Package structure and method of fabricating the same202411,990,383Package structure having at least one die with a plurality of taper-shaped die connectors202411,961,811Semiconductor structures and method of manufacturing the same202411,855,246Semiconductor device and method202311,823,969Packages with enlarged through-vias in encapsulant202311,823,936Alignment holder and testing apparatus202311,789,366Method for removing resist layer, and method of manufacturing semiconductor202311,756,879Semiconductor devices and methods of manufacturing the same202311,742,317Process including a re-etching process for forming a semiconductor structure202311,670,582Package structure and method of fabricating the same202311,664,325Semiconductor structure and method of fabricating the same202311,651,994Processes for reducing leakage and improving adhesion202311,646,281Semiconductor structures202311,600,574Method of forming RDLS and structure formed thereof202311,587,902Semiconductor structure and method of forming the same202311,557,561Package structure and method of fabricating the same202311,527,466Semiconductor device having via sidewall adhesion with encapsulant202211,515,224Packages with enlarged through-vias in encapsulant202211,515,276Integrated circuit, package structure, and manufacturing method of package structure202211,508,633Package structure having taper-shaped conductive pillar and method of forming thereof202211,488,908Semiconductor device and method202211,450,641Method of fabricating package structure202211,417,604Dense redistribution layers in semiconductor packages and methods of forming the same202211,404,308Semiconductor package and method202211,378,886Method for removing resist layer, and method of manufacturing semiconductor202211,335,579Method for manufacturing a semiconductor package and method for testing bonding strength of composite specimen202211,251,121Package structure and method of fabricating the same202211,244,906Semiconductor structure and method of fabricating the same202211,232,971Workpiece holding mechanism, process system and manufacturing method of semiconductor structure202211,158,775Semiconductor device and method2021Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2021–2025Patents assigned to TAIWAN SEMICONDUCTOR MFG CO LTD (48)· patent assignee history
2021–2025Based in TW· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TAIWAN SEMICONDUCTOR MFG CO LTD | 48 | 2021–2025 |
Locations
| Location | Patents | Span |
|---|---|---|
| TW | 48 | 2021–2025 |