LexDanaLexDanabeta
Inventor

Xiaoye Wu

Inventor
Rexford, NY, US

Overview

55→
Patents
2004–2016
Patent span
Human necessities
Primary field (CPC A)

Patents· 55 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

A61Bprimary
A61BDiagnosis48%
G06TImage data processing or generation, in general18%
G01TMeasurement of nuclear or x-radiation10%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests7%
G01NInvestigating or analysing materials by determining their chemical or physical properties6%
H01JElectric discharge tubes or discharge lamps3%
G01VGeophysics2%
G21KHandling of particles or ionising radiation not otherwise provided for2%
B29DProducing particular articles from plastics or from substances in a plastic state1%
G16HHealthcare informatics, i.e. information and communication technology [ict] specially adapted for the handling or processing of medical or healthcare data1%
PatentTitleYear
9,320,477'Method and apparatus for adaptive scatter correction'20169,070,181'System and method for extracting features of interest from an image'20159,025,815'System and method for multi-material correction of image data'20158,942,341'Method of dose reduction for CT imaging and apparatus for implementing same'20158,811,709'System and method for multi-material correction of image data'20148,611,627'CT spectral calibration'20138,483,471'Method and system for scatter correction in X-ray imaging'20138,483,361'Anode target for an x-ray tube and method for controlling the x-ray tube'20138,401,266'Method and system for correlated noise suppression in dual energy imaging'20138,396,185'Method of fast current modulation in an X-ray tube and apparatus for implementing same'20138,396,273'Noise reduction method for dual-energy imaging'20138,385,499'2D reflector and collimator structure and method of manufacturing thereof'20138,363,779'System and method of acquiring multi-energy CT imaging data'20138,315,352'System and method of spectral calibration and basis material decomposition for X-ray CT systems'20128,260,023'Forward projection for the generation of computed tomography images at arbitrary spectra'20128,218,837'Material composition detection from effective atomic number computation'20128,199,875'System and method of acquiring multi-energy CT imaging data'20128,199,874'System and method of mitigating low signal data for dual energy CT'20128,160,206'Dual-energy imaging at reduced sample rates'20128,160,200'Method and system for image data acquisition'20128,155,263'Apparatus and method for voltage modulation in X-ray computed tomography'20128,155,265'Asymmetric de-populated detector for computed tomography and method of making same'20128,055,039'System and method to obtain noise mitigated monochromatic representation for varying energy level'20117,995,702'System and method of data interpolation in fast kVp switching dual energy CT'20117,929,659'System and method for generating computed tomography images'20117,885,372'System and method for energy sensitive computed tomography'20117,835,486'Acquisition and reconstruction of projection data using a stationary CT geometry'20107,826,587'System and method of fast kVp switching for dual energy CT'20107,813,474'Method and apparatus for performing dual-spectrum CT with fast KV modulation at multiple-view intervals'20107,801,264'Method for calibrating a dual -spectral computed tomography (CT) system'20107,792,241'System and method of fast KVP switching for dual energy CT'20107,756,239'Diagnostic imaging two non K-edge basis materials plus N K-edge contrast agents'20107,747,057'Methods and apparatus for BIS correction'20107,724,865'System and method of optimizing a monochromatic representation of basis material decomposed CT images'20107,697,657'System and method of density and effective atomic number imaging'20107,613,274'Method and system of energy integrating and photon counting using layered photon counting detector'20097,609,802'Method and system for reconstructing image volumes from helical scan acquisitions'20097,606,347'Photon counting x-ray detector with overrange logic control'20097,492,855'System and method for detecting an object'20097,466,793'Distinct incident energy spectra detection'20087,433,443'System and method of CT imaging with second tube/detector patching'20087,391,844'Method and apparatus for correcting for beam hardening in CT images'20087,379,527'Methods and apparatus for CT calibration'20087,346,203'Methods and apparatus for processing image data to aid in detecting disease'20087,308,073'X-ray filter having dynamically displaceable x-ray attenuating fluid'20077,298,812'Image-based material decomposition'20077,283,605'Methods and apparatus for scatter correction'20077,280,631'Stationary computed tomography system and method'20077,260,172'Method and system of CT data correction'20077,086,780'Methods for spectrally calibrating CT imaging apparatus detectors'20067,031,426'Methods and system for detecting components of plaque'20066,904,118'Method and apparatus for generating a density map using dual-energy CT'20056,904,120'Method and apparatus for correcting bone induced spectral artifacts'20056,848,827'Method and apparatus for calibrating detector spectral response'20056,836,528'Methods and apparatus for detecting structural, perfusion, and functional abnormalities'2004

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2004–2016Based in Rexford, NY, US· patent location history
2005–2016Patents assigned to GEN ELECTRIC (52)· patent assignee history
2012–2016Patents assigned to WU XIAOYE (20)· patent assignee history
2012–2016Patents assigned to HSIEH JIANG (10)· patent assignee history
2012–2015Patents assigned to LANGAN DAVID ALLEN (5)· patent assignee history
2012–2013Patents assigned to CHANDRA NAVEEN (4)· patent assignee history
2012Based in Niskayuna, NY, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
GEN ELECTRIC522005–2016
WU XIAOYEself202012–2016
HSIEH JIANG102012–2016
LANGAN DAVID ALLEN52012–2015
CHANDRA NAVEEN42012–2013
Locations
LocationPatentsSpan
Rexford, New York, US542004–2016
Niskayuna, New York, US12012