Inventor
Toshiyasu Hishii
Inventor
Tokyo, JP
Overview
Patents· 3 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
A61Bprimary
A61BDiagnosis20%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure20%
G01NInvestigating or analysing materials by determining their chemical or physical properties20%
G01RMeasuring electric variables20%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1020%
PatentTitleYear
5,532,610'Apparatus for testing semicondctor wafer'19965,086,777'Small-sized disposable pressure transducer apparatus with a temperature compensating circuit disposed adjacent a passageway coupled with a catheter'19924,377,944'Integrated gas sensitive unit comprising a gas sensitive semiconductor element and a resistor for gas concentration measurement'1983Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1983Patents assigned to NIPPON ELECTRIC CO (1)· patent assignee history
1983–1996Based in Tokyo, JP· patent location history
1992–1996Patents assigned to NEC CORP (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NEC CORP | 2 | 1992–1996 |
| NIPPON ELECTRIC CO | 1 | 1983 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 3 | 1983–1996 |