Inventor
Günter Igel
Inventor
Teningen, DE
Overview
Patents· 29 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Pprimary
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1014%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1014%
G01NInvestigating or analysing materials by determining their chemical or physical properties10%
C12MApparatus for enzymology or microbiology8%
C12NMicroorganisms or enzymes8%
H10DInorganic electric semiconductor devices8%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests8%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure6%
B81CProcesses or apparatus specially adapted for the manufacture or treatment of microstructural devices or systems4%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation4%
PatentTitleYear
7,720,265'Fingerprint recognition module having a thin-film structure and comprising resistive, temperature-sensitive elements'20107,501,276'Apparatus for intracellular manipulation of a biological cell'20096,964,927'Method and production of a sensor'20056,916,673'Method for producing an optical transmitting and receiving device and a transmitting and receiving device produced according to said method'20056,765,394'Capacitive magnetic field sensor'20046,656,678'Method for examination of a surface layer'20036,642,126'Process for manufacturing a semiconductor wafer with passivation layer mask for etching with mechanical removal'20036,638,743'Method for measuring a state variable'20036,572,748'Reference electrode'20036,475,760'Method for intracellular manipulation of a biological cell'20026,471,838'Measuring device and process for its manufacture'20026,460,416'Capacitor structure and fabrication process'20026,413,474'Measuring device'20026,413,440'Process for manufacturing a micro-electrode'20026,369,435'Semiconductor component'20026,368,851'Method and apparatus for measuring a state variable'20026,346,675'Coupling and method for its manufacture'20026,294,218'Process for coating a substrate'20016,288,440'Chip arrangement'20016,225,653'Semiconductor components and methods of manufacturing semiconductor components'20016,191,489'Micromechanical layer stack arrangement particularly for flip chip or similar connections'20015,976,901'Process for manufacturing semiconductor devices with active structures'19995,944,976'Process for forming adjacent moats or holes'19995,933,715'Process for manufacturing discrete electronic devices'19995,890,807'Method for identifying an apparatus or device utilizing a randomly produced characteristic thereof'19995,885,897'Process for making contact to differently doped regions in a semiconductor device, and semiconductor device'19995,858,808'Process and auxiliary device for fabricating semiconductor devices'19995,824,595'Method of separating electronic elements'19985,789,307'Method of separating electronic devices contained in a carrier'1998Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1998–1999Patents assigned to ITT IND GMBH DEUTSCHE (5)· patent assignee history
1998–2010Based in Teningen, DE· patent location history
1998–1999Based in Emmendingen, DE· patent location history
1999–2002Patents assigned to MICRONAS INTERMETALL GMBH (3)· patent assignee history
1999Patents assigned to GEN SEMICONDUCTOR INC (1)· patent assignee history
2001–2009Patents assigned to MICRONAS GMBH (19)· patent assignee history
2010Patents assigned to INABILLION AS (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MICRONAS GMBH | 19 | 2001–2009 |
| ITT IND GMBH DEUTSCHE | 5 | 1998–1999 |
| MICRONAS INTERMETALL GMBH | 3 | 1999–2002 |
| GEN SEMICONDUCTOR INC | 1 | 1999 |
| INABILLION AS | 1 | 2010 |
Locations
| Location | Patents | Span |
|---|---|---|
| Teningen, DE | 27 | 1998–2010 |
| Emmendingen, DE | 2 | 1998–1999 |