Inventor

John E. McDermid

Inventor
Loveland, CO, US

Overview

19→
Patents
1986–2009
Patent span
Physics
Primary field (CPC G)

Patents· 19 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables67%
F02PIgnition, other than compression ignition, for internal-combustion engines8%
G01FMeasuring volume, volume flow, mass flow or liquid level8%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h108%
G01NInvestigating or analysing materials by determining their chemical or physical properties4%
G06FElectric digital data processing4%
PatentTitleYear
7,474,105'Soil moisture sensor systems and methods'20097,324,901'Water measurement auto-networks'20086,925,398'Water measurement apparatus and methods'20056,876,214'Method and apparatus for configurable hardware augmented program generation'20056,636,061'Method and apparatus for configurable hardware augmented program generation'20036,529,019'Multiple axis magnetic test for open integrated circuit pins'20036,467,051'Method and apparatus for selecting test point nodes of a group of components having both accessible and inaccessible nodes for limited access circuit test'20026,334,100'Method and apparatus for electronic circuit model correction'20016,327,545'Method and apparatus for board model correction'20016,266,787'Method and apparatus for selecting stimulus locations during limited access circuit test'20016,263,476'Method and apparatus for selecting targeted components in limited access test'20016,237,118'Method and apparatus for correcting for detector inaccuracies in limited access testing'20016,233,706'Method and apparatus for limited access circuit test'20016,097,203'Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry'20006,087,842'Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry'20005,968,191'Method and apparatus for testing integrated circuits in a mixed-signal environment'19995,469,064'Electrical assembly testing using robotic positioning of probes'19955,274,336'Capacitively-coupled test probe'19934,563,636'Connection verification between circuit board and circuit tester'1986

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1986–1999Patents assigned to HEWLETT PACKARD CO (4)· patent assignee history
1986–2009Based in Loveland, CO, US· patent location history
1999Patents assigned to FORD MOTOR CO (1)· patent assignee history
2000–2005Patents assigned to AGILENT TECHNOLOGIES INC (12)· patent assignee history
2005–2009Patents assigned to COLORADO VNET LLC (3)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
AGILENT TECHNOLOGIES INC122000–2005
HEWLETT PACKARD CO41986–1999
COLORADO VNET LLC32005–2009
FORD MOTOR CO11999
Locations
LocationPatentsSpan
Loveland, CO, US191986–2009