Inventor
Leon Stok
Inventor
Croton-on-Hudson, NY, US
Overview
Patents· 10 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Fprimary
G06FElectric digital data processing91%
G01RMeasuring electric variables9%
PatentTitleYear
10,839,133Circuit layout similarity metric for semiconductor testsite coverage20208,473,885'Physical design system and method'20138,219,943'Physical design system and method'20127,536,664'Physical design system and method'20097,178,120'Method for performing timing closure on VLSI chips in a distributed environment'20077,047,163'Method and apparatus for applying fine-grained transforms during placement synthesis interaction'20066,966,046'CMOS tapered gate and synthesis method'20056,557,159'Method for preserving regularity during logic synthesis'20036,334,205'Wavefront technology mapping'20016,167,557'Method and apparatus for logic synthesis employing size independent timing optimization'2000Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2000–2020Patents assigned to IBM (10)· patent assignee history
2000–2001Based in Mount Kisco, NY, US· patent location history
2003–2020Based in Croton-on-Hudson, NY, US· patent location history
2012–2013Patents assigned to COHN JOHN M (2)· patent assignee history
2012–2013Patents assigned to CULP JAMES A (2)· patent assignee history
2012–2013Patents assigned to FINKLER ULRICH A (2)· patent assignee history
2012–2013Patents assigned to HENG FOOK-LUEN (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 10 | 2000–2020 |
| COHN JOHN M | 2 | 2012–2013 |
| CULP JAMES A | 2 | 2012–2013 |
| FINKLER ULRICH A | 2 | 2012–2013 |
| HENG FOOK-LUEN | 2 | 2012–2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Croton-on-Hudson, New York, US | 8 | 2003–2020 |
| Mount Kisco, New York, US | 2 | 2000–2001 |