Inventor
Miyuki Niikura
Inventor
Kawasaki, JP
Overview
Patents· 1 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
B82Yprimary
B82YSpecific uses or applications of nanostructures25%
G01KMeasuring temperature25%
G01QScanning-probe techniques or apparatus25%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests25%
PatentTitleYear
5,929,438'Cantilever and measuring apparatus using it'1999Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1999Patents assigned to NIKON CORP (1)· patent assignee history
1999Based in Kawasaki, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NIKON CORP | 1 | 1999 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kawasaki, JP | 1 | 1999 |