Inventor
Ralf Arnold
Inventor
Poing, DE
Overview
Patents· 19 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables21%
G01BMeasuring length, thickness or similar linear dimensions17%
G01MTesting static or dynamic balance of machines or structures14%
Y10TTechnical subjects covered by former us classification14%
G06FElectric digital data processing10%
G02BOptical elements, systems or apparatus7%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices7%
B26DCutting3%
G11CStatic stores3%
H03MCoding3%
PatentTitleYear
8,860,592'Signal generating circuit'20148,853,642'Beam regulating apparatus for an EUV illumination beam'20148,508,749'Method of measuring a deviation of an optical surface from a target shape using interferometric measurement results'20138,264,695'Method of measuring a deviation of an optical surface from a target shape'20128,159,678'Method of measuring a deviation of an optical surface from a target shape'20127,936,521'Method of measuring a deviation of an optical surface from a target shape'20117,728,987'Method of manufacturing an optical element'20107,640,469'Electronic element comprising an electronic circuit which is to be tested and test system arrangement which is used to test the electronic element'20097,605,926'Optical system, method of manufacturing an optical system and method of manufacturing an optical element'20097,453,282'Input and output circuit of an integrated circuit and a method for testing the same'20087,386,776'System for testing digital components'20087,355,414'Test apparatus with low-reflection signal distribution'20087,331,005'Semiconductor circuit device and a system for testing a semiconductor apparatus'20087,308,628'Input switching arrangement for a semiconductor circuit and test method for unidirectional input drivers in semiconductor circuits'20077,139,127'Diffractive optical element'20067,028,162'Configurable processing block capable of interacting with external hardware'20066,996,709'Method for configuring a configurable hardware block by configuring configurable connections provided around a given type of subunit'20066,885,963'Method for testing a program-controlled unit by an external test device'20056,101,910'Apparatus for cutting tubes'2000Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2000Based in Metzingen, DE· patent location history
2005–2014Patents assigned to INFINEON TECHNOLOGIES AG (9)· patent assignee history
2005–2014Based in Poing, DE· patent location history
2006–2014Based in Aalen, DE· patent location history
2011–2014Patents assigned to ZEISS CARL SMT GMBH (4)· patent assignee history
2012–2013Patents assigned to ARNOLD RALF (2)· patent assignee history
2012–2013Patents assigned to DOERBAND BERND (2)· patent assignee history
2012–2013Patents assigned to SCHULTE STEFAN (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| INFINEON TECHNOLOGIES AG | 9 | 2005–2014 |
| ZEISS CARL SMT GMBH | 4 | 2011–2014 |
| ARNOLD RALFself | 2 | 2012–2013 |
| DOERBAND BERND | 2 | 2012–2013 |
| SCHULTE STEFAN | 2 | 2012–2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Poing, DE | 10 | 2005–2014 |
| Aalen, DE | 8 | 2006–2014 |
| Metzingen, DE | 1 | 2000 |