Inventor

Kenji Watanabe

Inventor

Tokyo, JP

Overview

1977–2020

Patent span

Physics

Primary field (CPC G)

Patents· 439 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary

G01NInvestigating or analysing materials by determining their chemical or physical properties11%

B41JTypewriters10%

H01JElectric discharge tubes or discharge lamps8%

G06FElectric digital data processing5%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h104%

Y10TTechnical subjects covered by former us classification4%

G03GElectrography3%

H04NPictorial communication, e.g. television3%

B65HHandling thin or filamentary material, e.g. sheets, webs, cables3%

G06TImage data processing or generation, in general2%

PatentTitleYear

10,771,672Detachable-head-type camera and work machine2020 10,662,013Sheet conveying device and image forming apparatus2020 10,648,164Flush toilet2020 10,620,092Inertia verification device for chassis dynamometer system2020 10,582,252Display device, television receiver, program, and recording medium2020 10,476,097Method of manufacturing secondary battery and apparatus for the same2019 10,446,404Electron-beam irradiated area adjustment method and adjustment system, electron-beam irradiated region correction method, and electron beam irradiation apparatus2019 10,304,613Coil component2019 10,271,939Treatment method and medical apparatus2019 10,271,705Autonomous travel-type cleaner2019 10,253,489Flush toilet2019 PP030148None2019 10,194,105Solid-state imaging device and camera for suppressing vertical line noise2019 10,160,601Belt transporting device and image forming apparatus2018 10,157,722Inspection device2018 10,120,322Image forming apparatus2018 10,002,740Inspection device2018 10,002,565Display unit, method of driving the same, and control pulse generation device2018 9,966,227Specimen observation method and device using secondary emission electron and mirror electron detection2018 9,946,078Head-up display device2018 9,933,692Head-up display device2018 9,903,919'Deterioration determination device for vehicle-driving battery'2018 9,819,920'Head-up display device'2017 9,796,550'Sheet conveying device and image forming apparatus'2017 9,771,221'Belt transporting device and image forming apparatus'2017 9,769,883'Induction heating cooker'2017 9,760,247'Operation display device of chassis dynamometer system'2017 9,647,612'Power amplifying apparatus and power amplifying method'2017 9,551,670'Surface inspection apparatus and method thereof'2017 9,507,288'Image forming apparatus that detects electrostatic latent image for correction'2016 9,455,258'Semiconductor device and method of designing the same'2016 9,406,480'Testing apparatus using charged particles and device manufacturing method using the testing apparatus'2016 9,368,314'Inspection system by charged particle beam and method of manufacturing devices using the system'2016 9,327,930'Sheet conveying device and image forming apparatus'2016 9,281,723'Rotary electric machine with tapered permanent magnet'2016 9,212,004'Belt transporting device and image forming apparatus'2015 9,194,826'Electron beam apparatus and sample observation method using the same'2015 9,178,406'Linear motor and stage device'2015 9,172,281'Motor'2015 9,134,695'Image forming apparatus with movable cartridge pressing member'2015 9,105,444'Electro-optical inspection apparatus and method with dust or particle collection function'2015 9,102,483'Sheet conveying apparatus and image forming apparatus'2015 9,091,989'Color image forming apparatus'2015 9,063,022'Warm-up operation display device of chassis dynamometer system'2015 9,055,615'Induction heating cooker'2015 9,042,754'Image forming apparatus having latent image timing'2015 9,035,223'Induction heat cooking device'2015 8,991,819'Sheet conveying device and image forming apparatus'2015 8,980,580'Heterologous expression of fungal polyketide synthetic gene in yeast and a method of preparing a compound produced by a protean encoded by the polyketide synthetic gene by the heterologous expression'2015 8,971,732'Image forming apparatus with a sheet detection unit that detects a sheet in the conveyance path and in the storage unit'2015 8,946,631'Testing apparatus using charged particles and device manufacturing method using the testing apparatus'2015 8,937,283'Specimen observation method and device using secondary emission electron and mirror electron detection'2015 8,891,984'Color image forming apparatus'2014 8,865,472'Analyzing apparatus and method that use centrifugal force'2014 8,860,271'Rotating electric machine'2014 8,858,081'Sliding bearing'2014 8,849,178'Sheet detecting apparatus and image forming apparatus'2014 8,822,919'Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former'2014 8,807,559'Sheet conveying apparatus and image forming apparatus'2014 8,803,103'Inspection system by charged particle beam and method of manufacturing devices using the system'2014 8,796,599'Induction heat cooking device capable of preheating object using an output value of an infrared sensor'2014 8,742,341'Testing apparatus using charged particles and device manufacturing method using the testing apparatus'2014 8,740,215'Sheet conveying apparatus and image forming apparatus'2014 8,729,434'Induction cooking device'2014 8,727,339'Sheet feeding apparatus and image forming apparatus'2014 8,729,514'Surface inspection apparatus and method thereof'2014 8,699,879'Optical packet switching apparatus'2014 8,693,874'Transmission system and method of correcting tilt of the transmission system'2014 8,682,240'Image forming apparatus'2014 8,674,317'Sample surface inspection apparatus and method'2014 8,651,742'Sliding bearing'2014 8,624,182'Electro-optical inspection apparatus and method with dust or particle collection function'2014 8,616,774'Sliding bearing'2013 8,616,548'Sheet conveying device and image forming apparatus'2013 8,600,274'Color image forming apparatus'2013 8,558,173'Method of inspecting pattern and inspecting instrument'2013 8,559,000'Method of inspecting a semiconductor device and an apparatus thereof'2013 8,541,723'Induction heat cooking device'2013 8,529,696'Method for producing hexagonal boron nitride single crystals'2013 8,524,804'Surface-treated fiber, resin composition, and molded article of the composition'2013 8,497,476'Inspection device'2013 8,487,940'Display device, television receiver, display device control method, programme, and recording medium'2013 8,439,358'Sheet conveying apparatus and image forming apparatus'2013 8,433,035'X-ray fluorescence analyzing method'2013 8,430,393'Sheet feeding apparatus and image forming apparatus'2013 8,395,688'Solid-state imaging device having a shortened correlated double sampling (CDS) period, driving method of the same, and camera including the same'2013 8,368,031'Inspection system by charged particle beam and method of manufacturing devices using the system'2013 8,368,016'Electron beam apparatus and a device manufacturing method by using said electron beam apparatus'2013 8,350,197'Induction heating cooker'2013 8,342,519'Sheet conveying device and image forming apparatus'2013 8,334,487'Induction heating cooking device'2012 8,326,147'Transmission apparatus, transmission controlling method, and optical supervisory channel (OSC) processing apparatus'2012 8,318,305'Resin composition'2012 8,274,651'Method of inspecting a semiconductor device and an apparatus thereof'2012 8,273,824'Process for producing resin composition'2012 8,258,603'Solid-state high-luminance far ultraviolet light emitting element including highly pure hexagonal boron nitride single crystal'2012 8,256,386'Saddle-ride vehicle'2012 8,247,748'Induction heating cooker'2012 8,212,192'Induction heating cooker'2012 8,172,227'Sheet detecting device and image forming apparatus'2012 8,134,456'Turn signal indicator lamp apparatus for a motorcycle, and motorcycle including same'2012 8,124,933'Mapping-projection-type electron beam apparatus for inspecting sample by using electrons emitted from the sample'2012 8,096,798'Gas hydrate compression molding machine'2012 8,076,654'Sample surface inspection apparatus and method'2011 8,072,597'Method and its apparatus for inspecting particles or defects of a semiconductor device'2011 8,053,726'Inspection system by charged particle beam and method of manufacturing devices using the system'2011 8,040,503'Method of inspecting a semiconductor device and an apparatus thereof'2011 8,040,414'A/D converter-incorporated solid-state imaging device'2011 8,039,781'Physical quantity detecting apparatus and method for driving the same'2011 D0646725'Game device'2011 8,013,315'Charged particle beam apparatus, method of adjusting astigmatism using same and method of manufacturing device using same'2011 7,976,097'Cowl structure of vehicle'2011 7,952,085'Surface inspection apparatus and method thereof'2011 7,952,510'Solid-state imaging device, driving method thereof, and camera'2011 7,941,063'Image forming apparatus with loop control'2011 7,928,378'Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former'2011 7,925,944'Semiconductor device'2011 7,888,642'Electron beam apparatus and method of manufacturing semiconductor device using the apparatus'2011 7,873,659'Database management system, database management method and database management program'2011 7,863,554'Far ultraviolet with high luminance emitting high-purity hexagonal boron nitride monocrystalline powder and method of manufacturing the same'2011 7,829,853'Sample surface observation method'2010 7,811,909'Production of a hexagonal boron nitride crystal body capable of emitting out ultraviolet radiation'2010 7,754,151'Liquid homogenizer and analyzer employing the same'2010 7,745,784'Electron beam apparatus and method of manufacturing semiconductor device using the apparatus'2010 7,741,601'Testing apparatus using charged particles and device manufacturing method using the testing apparatus'2010 7,728,895'Solid-state image sensing device having shared floating diffusion portions'2010 7,705,831'Pad type input device and scroll controlling method using the same'2010 7,671,317'Physical quantity detecting apparatus and method for driving the same'2010 7,661,333'Rotation transmission member and manufacturing method therefor'2010 7,652,702'Solid state imaging device and imaging device'2010 7,643,138'Method of inspecting a semiconductor device and an apparatus thereof'2010 7,633,490'Input device'2009 7,593,837'Plant operation support system'2009 7,592,586'Mapping-projection-type electron beam apparatus for inspecting sample by using electrons reflected from the sample'2009 D0600599'Air cleaner cover for a motorcycle'2009 7,569,838'Electron beam inspection system and inspection method and method of manufacturing devices using the system'2009 7,556,450'Water collecting structure and drainage structure using the same'2009 7,537,436'Compressor'2009 7,521,692'TDI detecting device, a feed-through equipment, an electron beam apparatus using these device and equipment, and a semiconductor device manufacturing method using the same electron beam apparatus'2009 7,499,162'Method and apparatus for observing and inspecting defects'2009 7,490,541'Compressor'2009 7,483,560'Method for measuring three dimensional shape of a fine pattern'2009 7,479,634'Electron beam apparatus and device manufacturing method using the same'2009 7,476,856'Sample dimension-measuring method and charged particle beam apparatus'2009 PP019621'Pachysandra plant named â€˜Hakureiâ€™'2009 7,444,911'Slitter blade assembly'2008 7,446,287'Induction heating cooker with buoyancy reducing plate'2008 7,425,703'Electron beam apparatus, a device manufacturing method using the same apparatus, a pattern evaluation method, a device manufacturing method using the same method, and a resist pattern or processed wafer evaluation method'2008 7,423,267'Electron beam apparatus and method of manufacturing semiconductor device using the apparatus'2008 7,420,164'Objective lens, electron beam system and method of inspecting defect'2008 7,417,723'Method of inspecting a semiconductor device and an apparatus thereof'2008 7,417,244'Surface inspection apparatus and method thereof'2008 7,411,191'Inspection system by charged particle beam and method of manufacturing devices using the system'2008 7,411,207'Method and its apparatus for inspecting particles or defects of a semiconductor device'2008 7,408,175'Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former'2008 7,400,829'Transmission apparatus and path selection method of a transmission apparatus'2008 7,391,036'Sample surface inspection apparatus and method'2008 7,365,324'Testing apparatus using charged particles and device manufacturing method using the testing apparatus'2008 7,361,895'Electron beam apparatus and a device manufacturing method by using said electron beam apparatus'2008 7,355,643'Image pickup device'2008 7,351,969'Electron beam inspection system and inspection method and method of manufacturing devices using the system'2008 7,352,890'Method for analyzing circuit pattern defects and a system thereof'2008 7,352,195'Electron beam apparatus with detailed observation function and sample inspecting and observing method using electron beam apparatus'2008 7,336,303'Imaging device'2008 7,312,449'Electron beam system and method of manufacturing devices using the system'2007 7,285,010'TDI detecting device, a feed-through equipment and electron beam apparatus using these devices'2007 7,262,425'Method and its apparatus for inspecting particles or defects of a semiconductor device'2007 7,261,974'Battery-driven power source apparatus'2007 7,260,940'Heat pump using gas hydrate, and heat utilizing apparatus'2007 7,256,412'Method and its apparatus for inspecting particles or defects of a semiconductor device'2007 7,247,848'Electron beam apparatus and method of manufacturing semiconductor device using the apparatus'2007 7,242,016'Surface inspection apparatus and method thereof'2007 7,241,993'Inspection system by charged particle beam and method of manufacturing devices using the system'2007 7,223,973'Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former'2007 7,220,604'Method and apparatus for repairing shape, and method for manufacturing semiconductor device using those'2007 7,212,017'Electron beam apparatus with detailed observation function and sample inspecting and observing method using electron beam apparatus'2007 7,205,540'Electron beam apparatus and device manufacturing method using same'2007 7,176,459'Electron beam apparatus'2007 7,166,351'Fire-retardant antistatic vinyl chloride resin moldings'2007 7,166,824'High-frequency heating apparatus and control method thereof'2007 7,138,629'Testing apparatus using charged particles and device manufacturing method using the testing apparatus'2006 7,129,485'Electron beam apparatus and method of manufacturing semiconductor device using the apparatus'2006 7,116,817'Method and apparatus for inspecting a semiconductor device'2006 7,116,816'Method of inspecting a pattern and an apparatus thereof and a method of processing a specimen'2006 7,115,892'Method and its apparatus for inspecting particles or defects of a semiconductor device'2006 7,112,791'Method of inspecting pattern and inspecting instrument'2006 7,109,483'Method for inspecting substrate, substrate inspecting system and electron beam apparatus'2006 7,107,000'Image heating apparatus having flexible sleeve'2006 7,098,457'Electron beam apparatus and device manufacturing method using same'2006 7,095,022'Electron beam apparatus and method of manufacturing semiconductor device using the apparatus'2006 D0527053'Memory for portable liquid crystal game machine'2006 7,092,095'Method and apparatus for observing and inspecting defects'2006 D0526026'Memory case for portable liquid crystal game machine'2006 7,083,137'Film winding method, film winding apparatus, and film manufacturing apparatus'2006 D0526025'Portable liquid crystal game machine'2006 7,062,081'Method and system for analyzing circuit pattern defects'2006 7,061,602'Method of inspecting a semiconductor device and an apparatus thereof'2006 7,021,056'Exhaust heat recovery system'2006 D0517332'Seat for a motorcycle'2006 7,005,641'Electron beam apparatus and a device manufacturing method by using said electron beam apparatus'2006 6,998,630'Method and its apparatus for inspecting particles or defects of a semiconductor device'2006 6,998,611'Electron beam apparatus and device manufacturing method using same'2006 6,990,966'Heater unit for a combustion-stabilizing device and a combustion stabilizing device including the same'2006 6,992,290'Electron beam inspection system and inspection method and method of manufacturing devices using the system'2006 D0512669'Rear fender for a motorcycle'2005 6,971,550'Spouting structure for liquid container and bag-in-box container'2005 D0511718'Motorcycle'2005 D0511585'Tail light for a motorcycle'2005 6,952,492'Method and apparatus for inspecting a semiconductor device'2005 6,949,735'Beam source'2005 6,938,417'Exhaust heat recovery system'2005 6,936,835'Method and its apparatus for inspecting particles or defects of a semiconductor device'2005 6,909,092'Electron beam apparatus and device manufacturing method using same'2005 6,894,302'Surface inspection apparatus and method thereof'2005 6,888,959'Method of inspecting a semiconductor device and an apparatus thereof'2005 6,876,821'Color image forming apparatus and image quality control system'2005 6,855,929'Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former'2005 6,853,143'Electron beam system and method of manufacturing devices using the system'2005 6,842,540'Surveillance system'2005 6,838,648'Temperature detection unit in a high-frequency heating and cooking apparatus'2005 6,834,174'Image forming apparatus and rotary body detection device'2004 6,832,066'Image forming apparatus driving conveying medium or intermediate transferring medium and control method therefor'2004 6,820,864'Fuel vaporization promoting apparatus and fuel carburetion accelerator'2004 6,797,975'Method and its apparatus for inspecting particles or defects of a semiconductor device'2004 6,788,433'Character information processor'2004 6,777,677'Method of inspecting pattern and inspecting instrument'2004 6,757,621'Process management system'2004 6,755,371'Film winding method, film winding apparatus, and film manufacturing apparatus'2004 6,756,589'Method for observing specimen and device therefor'2004 6,720,541'High frequency heating apparatus with temperature detection means'2004 6,709,166'Connector assembly with multi-part housing'2004 6,703,850'Method of inspecting circuit pattern and inspecting instrument'2004 6,690,469'Method and apparatus for observing and inspecting defects'2004 6,657,738'Apparatus and method for processing character information'2003 6,650,409'Semiconductor device producing method, system for carrying out the same and semiconductor work processing apparatus included in the same system'2003 6,627,095'Magnetic recording disk and method of manufacturing same'2003 6,613,593'Method of fabricating a semiconductor device'2003 6,609,833'Latching system for connector assemblies'2003 6,597,448'Apparatus and method of inspecting foreign particle or defect on a sample'2003 6,593,152'Electron beam apparatus and method of manufacturing semiconductor device using the apparatus'2003 6,583,634'Method of inspecting circuit pattern and inspecting instrument'2003 6,583,414'Method of inspecting pattern and inspecting instrument'2003 6,571,766'Idle speed controller for internal combustion engine'2003 6,558,639'Apparatus and method for purifying fluids including contaminants'2003 6,542,830'Process control system'2003 6,527,450'Latching system for connector assemblies'2003 6,517,743'Epoxy resin composition having high neutron shielding ability, and a transparent shielding materials for neutron obtained by curing said epoxy resin composition'2003 6,508,236'Fuel supply device and internal combustion engine mounting the same'2003 6,491,454'Tape printing device and method'2002 6,490,604'Character information processing device equipped with a layout display function'2002 6,477,348'Image forming apparatus'2002 6,476,388'Scanning electron microscope having magnification switching control'2002 6,468,598'Magnetic disk and method of making thereof'2002 6,464,162'Web processing system'2002 6,441,912'Character display apparatus and character input apparatus'2002 6,438,509'Character layout method, image forming method and stamp-making method and apparatus therefor'2002 6,430,354'Methods of recording/reproducing moving image data and the devices using the methods'2002 6,426,475'Vacuum valve'2002 6,425,328'Plate-making sheet and plate-making sheet printing device'2002 6,424,122'Battery charging control unit and method for controlling battery charging'2002 6,421,032'Method of creating external characters in image forming apparatus'2002 6,386,774'Tape cartridge and printing device'2002 6,384,922'Tape printer'2002 6,376,791'Vacuum valve'2002 6,373,510'Tape printing apparatus and method of forming print image for tape'2002 6,357,691'Web processing system'2002 6,356,732'Image forming apparatus with selective color mode'2002 6,346,990'Method of selecting a character from a plurality of code character conversion tables'2002 6,316,118'Fire-retardant vinyl chloride resin molding'2001 6,295,926'Plate-making sheet and plate-making sheet printing device'2001 6,298,159'Method and device for forming/processing character string image'2001 6,290,327'Image-forming device and printing apparatus incorporating the device as well as image-forming method therefor'2001 6,287,030'Tape-printing apparatus with control of feeding and cutting of a tape'2001 6,283,654'Image-forming method and device and electronic apparatus incorporating the device'2001 6,281,024'Semiconductor device inspection and analysis method and its apparatus and a method for manufacturing a semiconductor device'2001 6,280,107'Peeling device, tape processing device incorporating the peeling device, and tape printing apparatus incorporating the tape processing device'2001 6,278,525'Character processing with indefinite continuous printing'2001 6,270,269'Tape printing device'2001 6,267,513'Fail-safe optical connector'2001 D0445516'Rotary lamp with a speaker for a motorcycle'2001 6,259,535'Print image-forming method and device'2001 6,254,973'Fluorine-containing polyfunctional (meth) acrylate, fluorine containing monomer composition, low refractivity material, and reflection reducing film'2001 6,251,247'Detection of degradation of RNA using microchannel electrophoresis'2001 6,226,094'Apparatus and method for processing character information'2001 D0440938'Plug'2001 6,194,048'Magnetic recording disk'2001 6,195,668'Tape printing and editing assembly'2001 6,181,433'Stamp-making method and apparatus'2001 6,168,323'Tape printing apparatus'2001 6,152,624'Stamp-making apparatus, as well as function changeover mechanism, exposure system and stamp-making object material-detecting device therefor'2000 6,149,325'Tape printing device and tape cartridge used therein'2000 6,146,034'Tape printing device with character enlargement and rotation logic'2000 6,145,561'Tape processing device with a coating device for the cutting blade and a static eliminator brush'2000 6,142,685'Character printing apparatus and method'2000 6,134,016'Character information printing apparatus'2000 6,129,462'Tape-printing apparatus'2000 6,129,467'Print image-forming method and device and printing apparatus incorporating the device'2000 6,126,344'Tape cartridge and printing device'2000 6,125,303'Stamp image forming method and apparatus and stamp-making apparatus'2000 6,120,200'Tape printing device'2000

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1977–2020Patents assigned to WATANABE KENJI (65)· patent assignee history

1986–2017Based in Nara, JP· patent location history

1987–2017Patents assigned to HITACHI LTD (43)· patent assignee history

1990–2019Based in Kanagawa, JP· patent location history

1991–2004Patents assigned to KING JIM CO LTD (118)· patent assignee history

1991–2019Based in Tokyo, JP· patent location history

1995–2004Patents assigned to SEIKO EPSON CORP (106)· patent assignee history

2000–2019Patents assigned to EBARA CORP (61)· patent assignee history

2001–2017Based in Oume, JP· patent location history

2011–2020Based in Suntou-gun, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
KING JIM CO LTD	118	1991–2004
SEIKO EPSON CORP	106	1995–2004
WATANABE KENJIself	65	1977–2020
EBARA CORP	61	2000–2019
HITACHI LTD	43	1987–2017

Locations

Location	Patents	Span
Tokyo, JP	157	1991–2019
Kanagawa, JP	44	1990–2019
Oume, JP	28	2001–2017
Suntou-gun, JP	27	2011–2020
Nara, JP	18	1986–2017